M. Katsuragawa

A compact imaging system with a CdTe double-sided strip detector for non-destructive analysis using negative muonic X-rays

Abstract A CdTe double-sided strip detector (CdTe-DSD) is an ideal device for imaging and spectroscopic measurements in the hard X-ray range above 10 keV. Recent development enables us to realize an imager with a detection area of ∼ 10 cm 2 . An energy resolution of 1–2 keV (FWHM) and a position resolution of a few hundred μ m are available from the detector. This type of imager has been long awaited for non-destructive elemental analysis, especially by using negative muons, because energies of characteristic X-rays from muonic atoms are about 200 time higher than those from normal atoms. With the method that uses negative muons, hard X-ray information gives the spatial distribution of elements in samples at a certain depth defined by the initial momentum of the muon beam. In order to study three-dimensional imaging capability of the method, we have developed a compact imaging system based on CdTe-DSD and a ϕ 3 mm pinhole collimator as the first prototype. We conducted experiments with samples which consist of layers of Al, BN and LiF irradiated by negative muon beams in MUSE/J-PARC and successfully reconstruct hard X-ray images of muonic X-rays from B, N and F at various depths.

Compact hard x-ray imaging system with a large FOV

We have developed a compact hard X-ray imaging system composed of a cadmium telluride double-sided strip detector (CdTe-DSD) and a coded mask. We investigate the imaging performance using two different coded masks with different sizes and patterns. In our system, a CdTe-DSD of pitch 250μm is used in conjunction with a coded mask is placed 70-100 mm above the detector to form a compact imaging system. We obtained an angular resolution of up to 11.8 arc min, as measured from gamma-ray lines of point-like radioactive isotope sources. This is consistent with that expected from the geometry. The energy resolution is 1.7 keV (FWHM) at 60 keV and the energy range of imaging is from 5 keV to 122 keV. These results agree very well with Monte Carlo simulations of the detector.

High-resolution CdTe detectors with application to various fields(Conference Presentation)

High-quality CdTe semiconductor detectors with both fine position resolution and high energy resolution hold great promise to improve measurement in various hard X-ray and gamma-ray imaging fields. ISAS/JAXA has been developing CdTe imaging detectors to meet scientific demands in latest celestial observation and severe environmental limitation (power consumption, vibration, radiation) in space for over 15 years. The energy resolution of imaging detectors with a CdTe Schottky diode of In/CdTe/Pt or Al/CdTe/Pt contact is a highlight of our development. We can extremely reduce a leakage current of devises, meaning it allows us to supply higher bias voltage to collect charges. The 3.2cm-wide and 0.75mm-thick CdTe double-sided strip detector with a strip pitch of 250 µm has been successfully established and was mounted in the latest Japanese X-ray satellite. The energy resolution measured in the test on ground was 2.1 keV (FWHM) at 59.5 keV. The detector with much finer resolution of 60 µm is ready, and it was actually used in the FOXSI rocket mission to observe hard X-ray from the sun. In this talk, we will focus on our research activities to apply space sensor technologies to such various imaging fields as medical imaging. Recent development of CdTe detectors, imaging module with pinhole and coded-mask collimators, and experimental study of response to hard X-rays and gamma-rays are presented. The talk also includes research of the Compton camera which has a configuration of accumulated Si and CdTe imaging detectors.