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Dive into the research topics where M. Kopczyk is active.

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Featured researches published by M. Kopczyk.


Journal of Applied Physics | 2009

Fe-Al interface intermixing and the role of Ti, V, and Zr as a stabilizing interlayer at the interface

Weerasinghe Priyantha; R.J. Smith; Hui Chen; M. Kopczyk; Michael Lerch; Camas Key; Ponnusamy Nachimuthu; Weilin Jiang

Fe-Al bilayer interfaces with and without interface stabilizing layers (Ti, V, Zr) were fabricated using dc magnetron sputtering. Intermixing layer thickness and the effectiveness of the stabilizing layer (Ti, V, Zr) at the interface were studied using Rutherford backscattering spectrometry (RBS) and x-ray reflectometry (XRR). The result for the intermixing thickness of the AlFe layer is always higher when Fe is deposited on Al as compared to when Al is deposited on Fe. By comparing measurements with computer simulations, the thicknesses of the AlFe layers were determined to be 20.6 A and 41.1 A for Al/Fe and Fe/Al bilayer systems, respectively. The introduction of Ti and V stabilizing layers at the Fe-Al interface reduced the amount of intermixing between Al and Fe, consistent with the predictions of model calculations. The Zr interlayer, however, was ineffective in stabilizing the Fe-Al interface in spite of the chemical similarities between Ti and Zr. In addition, analysis suggests that the Ti interlay...


Journal of Applied Physics | 2008

Interface mixing of Al/Fe and Fe/Al bilayer systems and the role of Ti as a stabilizing interlayer using Rutherford backscattering spectrometry and x-ray reflectometry

Weerasinghe Priyantha; Hui Chen; M. Kopczyk; R.J. Smith; A. Kayani; Andreas Comouth; M. Finsterbusch; Ponnusamy Nachimuthu; David E. McCready

Al∕Fe and Fe∕Al bilayer films with and without a Ti stabilizing interlayer at the interface have been grown on Si wafers using dc magnetron sputtering. X-ray reflectometry and Rutherford backscattering spectrometry were used to probe individual layer thicknesses and intermixing lengths. It is observed that the intermixing length is always higher when the Fe layer is on top of the Al layer. The samples with the Ti stabilizing layer, particularly when the Al layer is on top of the Fe, show that the Ti layer promotes the formation of abrupt interfaces.


Journal of Physics: Conference Series | 2009

High temperature oxidation resistance of magnetron-sputtered homogeneous CrAlON coatings on 430 steel

E. Garratt; K. J. Wickey; Manjula I. Nandasiri; A. Moore; S. AlFaify; X. Gao; A Kayani; R.J. Smith; T. L. Buchanan; W. Priyantha; M. Kopczyk; P E Gannon

The requirements of low cost and high-temperature corrosion resistance for bipolar interconnect plates in solid oxide fuel cell stacks has directed attention to the use of metal plates with oxidation resistant coatings. We have investigated the performance of steel plates with homogenous coatings of CrAlON (oxynitrides). The coatings were deposited using RF magnetron sputtering, with Ar as a sputtering gas. Oxygen in these coatings was not intentionally added. Oxygen might have come through contaminated nitrogen gas bottle, leak in the chamber or from the partial pressure of water vapors. Nitrogen was added during the growth process to get oxynitride coating. The Cr/Al composition ratio in the coatings was varied in a combinatorial approach. The coatings were subsequently annealed in air for up to 25 hours at 800 oC. The composition of the coated plates and the rate of oxidation were characterized using Rutherford backscattering (RBS) and nuclear reaction analysis (NRA). Surface characterization was carried out using Atomic Force Microscopy (AFM) and surfaces of the coatings were found smooth on submicron scale. From our results, we conclude that Al rich coatings are more susceptible to oxidation than Cr rich coatings.


20th International Conference on the Application of Accelerators in Research and Industry, CAARI 2008 | 2009

High Temperature Thermal Stability and Oxidation Resistance of Magnetron-sputtered Homogeneous CrAlON Coatings on 430 Steel

A. Kayani; K. J. Wickey; Manjula I. Nandasiri; A. Moore; E. Garratt; S. AlFaify; X. Gao; R.J. Smith; T. L. Buchanan; W. Priyantha; M. Kopczyk; P. E. Gannon; V. I. Gorokhovsky

The requirements of low cost and high‐temperature corrosion resistance for bipolar interconnect plates in solid oxide fuel cell stacks has directed attention to the use of metal plates with oxidation resistant coatings. We have investigated the performance of steel plates with homogenous coatings of CrAlON (oxynitrides). The coatings were deposited using RF magnetron sputtering, with Ar as a sputtering gas. Oxygen in these coatings was not intentionally added. Oxygen might have come through contaminated nitrogen gas bottle, leak in the chamber or from the partial pressure of water vapors. Nitrogen was added during the growth process to get oxynitride coating. The Cr/Al composition ratio in the coatings was varied in a combinatorial approach. The coatings were subsequently annealed in air for up to 25 hours at 800° C. The composition of the coated plates and the rate of oxidation were characterized using Rutherford backscattering (RBS) and nuclear reaction analysis (NRA). From our results, we conclude that...


Surface & Coatings Technology | 2006

Chromium volatility of coated and uncoated steel interconnects for SOFCs

Clare E. Collins; J. Lucas; T.L. Buchanan; M. Kopczyk; A. Kayani; Paul E. Gannon; Max Deibert; R.J. Smith; D.-S. Choi; Vladimir Gorokhovsky


Surface & Coatings Technology | 2006

Oxidation resistance of magnetron-sputtered CrAlN coatings on 430 steel at 800 °C

A. Kayani; T.L. Buchanan; M. Kopczyk; Clare E. Collins; J. Lucas; Kasey Lund; R. Hutchison; Paul E. Gannon; Max Deibert; R.J. Smith; D.-S. Choi; Vladimir Gorokhovsky


Surface & Coatings Technology | 2006

Oxidation studies of CrAlON nanolayered coatings on steel plates

A. Kayani; R.J. Smith; S. Teintze; M. Kopczyk; Paul E. Gannon; Max Deibert; Vladimir Gorokhovsky; V. Shutthanandan


Surface & Coatings Technology | 2008

Thermal stability and oxidation resistance of TiCrAlYO coatings on SS430 for solid oxide fuel cell interconnect applications

Hui Chen; J. Lucas; Weerasinghe Priyantha; M. Kopczyk; R.J. Smith; Kasey Lund; Camas Key; Martin Finsterbusch; Paul E. Gannon; Max Deibert; Vladimir Gorokhovsky; V. Shutthanandan; Ponnusamy Nachimuthu


Surface Science | 2010

Structure of ultra-thin Ti film on the Al(001) surface

M. Kopczyk; Weerasinghe Priyantha; N. Childs; Camas Key; Michael Lerch; R.J. Smith; D.S. Choi


Surface Science | 2012

Structure of V thin films on Al(100) using XPD, LEED, and LEIS

W. Priyantha; R. Droopad; M. Kopczyk; R.J. Smith; A. Kayani

Collaboration


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R.J. Smith

Montana State University

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A. Kayani

Western Michigan University

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Max Deibert

Montana State University

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Paul E. Gannon

Montana State University

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Camas Key

Montana State University

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Hui Chen

Montana State University

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J. Lucas

Montana State University

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Ponnusamy Nachimuthu

Pacific Northwest National Laboratory

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W. Priyantha

Montana State University

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