M. Skulinova

Advanced x-ray optics with Si wafers and slumped glass

We report on the continuation of the development of test samples of astronomical x-ray optics based on thermally formed glass foils and on bent Si wafers. Experiments with thermal glass forming have continued adding wider range of evaluated and optimized parameters including viscosity and internal stress analyses, as well as investigation of mounting influences. Experiments with Si wafers focused on their quality improvements such as flatness and thickness uniformity in order to better meet the requirements of future X-ray astronomy projects applications, as well as on study of their surface quality, defects analysis, and methods for its reproducible measurement.

Recent progress with x-ray optics based on Si wafers and glass foils

We report on recent progress with development of astronomical X-ray optics based on thermally formed glass foils and on bent Si wafers. Experiments with thermal glass forming have continued adding wider range of evaluated and optimized parameters. Recent efforts with Si wafers have been focused on their quality improvements such as flatness and thickness uniformity in order to better meet the requirements of future X-ray astronomy projects applications, as well as on study of their surface quality, defects analysis, and methods for its reproducible measurement. The role of substrates quality in performance of final mirror arrays, as required by large future space X-ray astronomy experiments was also studied. The problem of increasing size of Si wafers, required for some X-ray optics applications, is also addressed. First results of irradiation tests of selected substrates are also reported and discussed.

Novel x-ray optics with Si wafers and formed glass

The thermally formed thin glass foils and optically shaped Si wafers are considered to belong to the most promising technologies for future large space X-ray telescopes. We present and discuss the recent progress in these technologies, as well as properties of test mirrors produced and tested. For both technologies, both flat and curved samples have been produced and tested. The achieved profile accuracy is of order of 1 micrometer or better, while the bending technologies maintain the intrinsic fine surface microroughness of substrates (better than 0.5 nm for glass and around 0.1 nm for Si wafers).

Novel technologies for x-ray multi-foil optics

The future large space X-ray telescopes in study (such as the ESAs XEUS) require novel approaches and innovative lightweight technologies. Although there are several alternative possibilities, in general the shaped thin glass foils and shaped Si wafers are considered to belong to the most promising ones. We present and discuss the recent progress in these technologies, as well as properties of test mirrors produced and tested. For both technologies, both flat and curved samples have been produced and tested. The achieved profile accuracy is of order of 1 micrometer or better, while the bending technologies maintain the intrinsic fine surface microroughness of substrates (better than 0.5 nm).

Back-up technologies for IXO

We report on recent progress with development of astronomical X-ray optics based on thermally formed glass foils and on bent Si wafers. Experiments with thermal glass forming have continued adding wider range of evaluated and optimized parameters. Recent efforts with Si wafers have been focused on their quality improvements such as flatness and thickness uniformity in order to better meet the requirements of future X-ray astronomy projects applications, as well as on study of their surface quality, defects analysis, and methods for its reproducible measurement. The role of substrates quality in performance of final mirror arrays, as required by large future space X-ray astronomy experiments was also studied.

Progress in x-ray optics development with formed glass and Si wafers

The precisely shaped glass sheets and Si wafers are generally considered as the most promising substrates for future large space astronomical X-ray telescopes. Both approaches have demonstrated promising results obtained in the course of last years. In this contribution, we report on continued systematic efforts and analysis in precise shaping of thin glass sheets as well as Si wafers. New results will be briefly presented and discussed. For Si wafers, recent efforts focus also on improving the intrinsic quality of the slices to better meet the high requirements of future space projects.

Extremely lightweight x-ray optics based on thin substrates

We report on recent progress with development of astronomical X-ray optics based on bent Si wafers. Recent efforts with Si wafers have been focused on new forming technologies such as method of deposition of thin layers. The role of substrates quality in performance of final mirror arrays, as required by large future space X-ray astronomy experiments was also studied.

The feasibility of independent observations/detections of GRBs in X‐rays

According to the observational statistics a large majority of all GRBs exhibit X‐ray emission. In addition, a dedicated separate group of GRB, the XRFs, exists which emission dominates in the X‐ray spectral range. And the third group of GRB related objects (yet hypothetical) are the group of off‐axis observed GRBs (orphan afterglows). These facts justify the consideration of an independent experiment for monitoring, detection and analyses of GRBs and others fast X‐ray transients in X‐rays. We will present and discuss such experiment based on wide‐field X‐ray telescopes of Lobster Eye type. The wide field and fine sensitivity of Lobster Eye X‐ray All‐Sky Monitor make such instruments important tools in study of GRBs and related objects.

Alternative materials in view of new light weight x-ray optics

The ESAs invitation to participate in the innovative technology developments for the new space mission represents the natural continuation of the efforts of the Czech team in development of innovative X-ray telescopes, focusing on particular demands and requirements of a concrete project, with emphasis on fully new and light-weight technologies. In this paper we focus on studying of other alternative materials such as SiC or glassy carbon, which could be considered as suitable materials for the producing of precise light weight X-ray optics due to their physical and chemical properties and so far successfully compete with more common materials (like glass or Si) as well as on Si wafers with improved surface quality and analysis and evaluation of measured data.