Mahesh K. Jeerage
Honeywell
Network
Latest external collaboration on country level. Dive into details by clicking on the dots.
Publication
Featured researches published by Mahesh K. Jeerage.
IEEE Aerospace and Electronic Systems Magazine | 1990
Mahesh K. Jeerage
A systematic reliability analysis procedure for evaluating fault-tolerant inertial measurement unit (IMU) architectures is described. This reliability analysis procedure is based on modeling the system architecture, the component reliabilities, and the redundancy management. The component reliabilities are based on constant failure rates and exponential failure distributions. The procedure computes both the overall reliability of the IMU and the major contributors to the IMU reliability. This reliability analysis procedure is used to evaluate and compare three state-of-the-art fault-tolerant IMU architectures: the triple triad architecture, the dual quad architecture, and the hexad architecture.<<ETX>>A systematic reliability analysis procedure for evaluating fault-tolerant inertial measurement unit (IMU) architectures is described. The procedure is based on modeling the system architecture, the component reliabilities, and the redundancy management. The component reliabilities are based on constant failure rates and exponential failure distributions. The overall reliability of the IMU and the major contributors to IMU reliability are computed. Three state-of-the-art fault-tolerant IMU architectures are evaluated and compared using the procedure.<<ETX>>
Archive | 2009
Mahesh K. Jeerage; Fan Liu
Archive | 2006
Steven H. Thomas; Mahesh K. Jeerage; Conrad Mueller
Archive | 2010
Randolph G. Hartman; Erik Lindquist; Mahesh K. Jeerage; Wayne A. Soehren; James C. Kirk
Archive | 2004
Mahesh K. Jeerage; Charles T. Bye; Wayne A. Soehren
Archive | 2007
Robert A. Blaser; Mahesh K. Jeerage
Archive | 2013
Brian W. Schipper; Mahesh K. Jeerage
Archive | 2007
Erik Lindquist; Mahesh K. Jeerage
Archive | 2014
Gang Qian; Mahesh K. Jeerage; Yunqian Ma
Archive | 2006
Steven H. Thomas; Mahesh K. Jeerage; Conrad Mueller