Makoto Haseyama

Semiconductor testing device

IC socket, a test method using the same and an IC socket mounting mechanism

Contactor for semiconductor devices, a testing apparatus using such contactor, a testing method using such contactor, and a method of cleaning such contactor

Integrated circuit contactor, and method and apparatus for production of integrated circuit contactor

Semiconductor device having an alignment mark formed by the same material with a metal post

Electrical connecting device, and semiconductor device testing method

SEMICONDUCTOR ELEMENT TESTING CARRIER USING A MEMBRANE CONTACTOR AND A SEMICONDUCTOR ELEMENT TESTING METHOD AND APPARATUS USING SUCH A CARRIER

Semiconductor device testing method, using a spring-biased transformable conductive member electrode connection

Test board and a test method using the same providing improved electrical connection

Method and apparatus for passive optical characterization of semiconductor substrates subjected to high energy (MEV) ion implantation using high-injection surface photovoltage