Makoto Ogusu
Canon Inc.
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Featured researches published by Makoto Ogusu.
international microprocesses and nanotechnology conference | 1999
Ichiro Tanaka; Yuichi Iwasaki; Makoto Ogusu; Kenji Tamamori; Yoshiyuki Sekine; Takahiro Matsumoto; Hiroshi Maehara; Ryusho Hirose
Binary optical elements (BOE) tend to be used frequently in optical equipment because aspherical type BOE is easy to fabricate and the BOE can easily correct chromatic aberration. What makes this technology attractive to industry is that the BOE can be fabricated precisely by the semiconductor micro fabrication technique. However when it is used for more precise optics e.g. semiconductor exposure equipment, more precise BOE are necessary. In some manufacturing processes, we have confirmed that the alignment error between masks is the dominant factor to decrease diffraction efficiency by optical simulation. To study this problem, we have produced a BOE using a novel self-alignment method we have devised, then compared it to a BOE which has being made by a conventional method.
Proceedings of SPIE | 2008
Keita Sakai; Yuichi Iwasaki; Sunao Mori; Akihiro Yamada; Makoto Ogusu; Keiji Yamashita; Tomofumi Nishikawara; Takatoshi Tanaka; Noriyasu Hasegawa; Shinichi Hara; Yutaka Watanabe
ArF water immersion systems with a numerical aperture (NA) of over 1.3 have already introduced for the node up to 45- nm half-pitch production. For the next generation of lithography, we focus on ArF immersion lithography using high-index materials. At present, LuAG (n=2.14) is the most promising candidate as a high-index lens material. Second-generation fluids (n=1.64) have the sufficient performance as a high-index immersion fluid. The combination of LuAG and a second-generation fluid can enhance the NA up to 1.55 and the exposure system would be available for the 34-nm half-pitch node when k1 is 0.27. Although high-index immersion lithography is attractive since it is effective in raising resolution, there are some issues not encountered in water immersion system. The issues of LuAG are its availability and the intrinsic birefringence. Fluid degradation induced by dissolved oxygen or laser irradiation, lens contamination, and residual fluid on a wafer are the specific issues of the immersion system. In this article, we introduce the current status for the above issues and discuss the feasibility of ArF immersion system using high-index materials.
Archive | 1999
Mamoru Uchida; Makoto Ogusu
Archive | 1999
Takashi Kato; Kenji Saitoh; Hiroshi Maehara; Makoto Ogusu; Keiko Chiba
Archive | 2001
Makoto Ogusu; Yuichi Iwasaki
Archive | 1997
Makoto Ogusu; Hiroshi Maehara; Keita Sakai
Archive | 2000
Yuichi Iwasaki; Makoto Ogusu; 誠 小楠; 裕一 岩崎
Archive | 1997
Mamoru Uchida; Makoto Ogusu
Archive | 2006
Makoto Ogusu
Archive | 2001
Hideo Kato; Hiroshi Maehara; Makoto Ogusu