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Marco Sforzin

STMicroelectronics

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Publication

Featured researches published by Marco Sforzin.

international solid-state circuits conference | 2005

A 125 MHz burst-mode flexible read-while-write 256 Mbit 2b/c 1.8V NOR flash memory

C. Villa; D. Vimercati; S. Schippers; Emanuele Confalonieri; Marco Sforzin; S. Polizzi; M. La Placa; Carlo Lisi; Alessandro Magnavacca; E. Bolandrina; A. Martinelli; Vincenzo Dima; A. Scavuzzo; B. Calandrino; N. Del Gatto; M. Scardaci; F. Mastroianni; Michelangelo Pisasale; Antonio Geraci; M. Gaitiotti; M. Sali

A 1.8 V 256 Mb 2b/cell NOR flash memory is designed in a 130 nm technology. A fast gate-voltage-ramp constant-current-reading concept is implemented to obtain a robust read-while-write/erase function and 125 MHz burst read frequency.

Archive | 2006

Memory device with a ramp-like voltage biasing structure based on a current generator

Marco Sforzin; Nicola Del Gatto; Marco Ferrario; Emanuele Confalonieri

Archive | 2002

Decoding structure for a memory device with a control code

Emanuele Confalonieri; Marco Sforzin

Archive | 2001

High configurability output-buffer circuit

Lorenzo Bedarida; Marco Defendi; Claudio Nava; Marco Sforzin

Archive | 2005

Memory device and method for operating the same with high rejection of the noise on the high-voltage supply line

Nicola Del Gatto; Massimiliano Mollichelli; Massimiliano Scotti; Marco Sforzin

Archive | 2003

Circuit for biasing an input node of a sense amplifier with a pre-charge stage

Carla Poidomani; Emanuele Confalonieri; Marco Sforzin; Nicola Del Gatto

Archive | 2002

Output buffer for a nonvolatile memory with output signal switching noise reduction, and nonvolatile memory comprising the same

Emanuele Confalonieri; Antonino Geraci; Marco Sforzin; Lorenzo Bedarida

Archive | 2001

Direct-comparison reading circuit for a nonvolatile memory array

Antonino Geraci; Carlo Lisi; Lorenzo Bedarida; Marco Sforzin

Archive | 2003

Circuit for detecting a logic transition with improved stability of the length of a detection signal pulse

Emanuele Confalonieri; Marco Sforzin; Carla Poidomani; Carlo Lisi

Archive | 2006

Circuit for distributing a test signal applied to a pad of an electronic device

Nicola Del Gatto; Antonio Geraci; Marco Sforzin; Nicola Rosito

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Collaboration

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Emanuele Confalonieri

STMicroelectronics

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Nicola Del Gatto

STMicroelectronics

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Carlo Lisi

STMicroelectronics

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Lorenzo Bedarida

STMicroelectronics

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Massimiliano Mollichelli

STMicroelectronics

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Massimiliano Scotti

STMicroelectronics

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Antonino Geraci

STMicroelectronics

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Antonio Geraci

STMicroelectronics

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Carla Poidomani

STMicroelectronics

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Alessandro Magnavacca

STMicroelectronics

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