Marcus Schramm

Design and Fabrication of Broadband Hybrid GaAs Schottky Diode Frequency Multipliers

Frequency extender modules of vector network analyzers and signal generators, as well as front-end modules of semiconductor automatic test systems, make use of broadband resistive diode frequency multipliers. This paper presents the design and fabrication of innovative planar varistor frequency multipliers. Three frequency triplers (#1, #2, #3) and two frequency doublers (#4, #5), operating in the 60-110 GHz and 50-110 GHz frequency ranges, respectively, are designed. The hybrid architecture utilizes commercial gallium arsenide Schottky diodes from United Monolithic Semiconductors on thin-film processed high-permittivity alumina substrate. Synthesis is based on a co-simulation procedure between 3-D electromagnetic field and nonlinear harmonic balance circuit simulations. Scalar and spectral measurement data over the focused output frequency ranges are presented. Conversion loss values around 18 dB from 60 to 95 GHz and below 22 dB from 60 to 110 GHz are achieved with frequency tripler #1. Frequency doubler #5 achieves conversion loss values below 15 dB from 50 to 89 GHz and below 22 dB from 50 to 110 GHz. A comprehensive comparison of the presented work with reported frequency multipliers is included.

Planar varistor mode Schottky diode frequency tripler covering 60 GHz to 110 GHz

Frequency extender modules of vector network analyzers (VNA) and signal generators, as well as front end modules of semiconductor automatic testsystems (ATS) make use of broadband resistive diode frequency multipliers. We present the design and construction of a planar varistor tripler utilizing commercial gallium arsenide (GaAs) Schottky diodes on thin-film processed alumina (Al2O3) substrate. Synthesis is based on a co-simulation procedure between 3D electromagnetic field (EM) and nonlinear circuit simulations. Measurement data over the focused output frequency range from 60 GHz to 110 GHz is presented.

Measurement setup for non-destructive complex permittivity determination of solid materials using two coupled coaxial probes

A non-destructive microwave measurement setup for broadband complex permittivity determination of solid materials over a frequency band from 0.05 GHz to 6 GHz is presented. The setup design was optimized for measurements of glass materials with planar and convex surfaces, but works with other dielectric materials as well. The measurement method is based on the near field coupling of two open-ended coaxial probes through the material under test (MUT). A theoretical modeling of this measurement configuration was performed, using a 3D full-wave electromagnetic field simulator. Two identical coaxial probes and an equivalent calibration kit, in order to perform a TRL calibration of the proposed setup, were designed. The calibration procedure of the measurement setup is explained and experimental results are presented.

MOS-16: A new method for in-fixture calibration and fixture characterization

The calibration of test fixtures or the estimation of their performance are well known tasks. In the case of fixtures with variable length, there are some established methods to de-embed the DUT (Device Under Test). The calibration or evaluation of a fixture with a fixed length, like a socket or a probe-card offers less possibilities. This contribution presents a novel calibration procedure, capable of gathering not only the information required for a proper de-embedding but also for an absolute characterization of fixed length fixtures, including crosstalk. In order to achieve this, specific assumptions have to be made. These assumptions, the resulting calibration scheme as well as a first validation through a known device will be addressed together with a first discussion on error propagation.