Maria A. Yagovkina

X-ray determination of threading dislocation densities in GaN/Al2O3(0001) films grown by metalorganic vapor phase epitaxy

Densities of a- and a+c-type threading dislocations for a series of GaN films grown in different modes by metalorganic vapor phase epitaxy are determined from the x-ray diffraction profiles in skew geometry. The reciprocal space maps are also studied. Theory of x-ray scattering from crystals with dislocations is extended in order to take into account contribution from both threading and misfit dislocations. The broadening of the reciprocal space maps along the surface normal and the rotation of the intensity distribution ellipse is attributed to misfit dislocations at the interface. We find that the presence of a sharp AlN/GaN interface leads to an ordering of misfit dislocations and reduces strain inhomogeneity in GaN films.

Structural, electrical, and optical properties of low-doped 4H–SiC chemical vapor deposited epitaxial layers

Results of complex studies of structural, optical, and electrical characteristics of 4H–SiC n-type low-doped epitaxial layers grown by the chemical vapor deposition (CVD) method are presented. Characteristics of CVD layers grown on commercial wafers with and without a thin (<0.1 μm) buffer layer grown by liquid phase epitaxy (LPE) between the commercial wafer and CVD epitaxial layer were compared. It has been shown that the LPE filling process caused a significant improvement in the structural quality of CVD layers. Cathodoluminescence (CL) data and electrical characteristics of Schottky barriers (SB) revealed that the LPE layer also made the concentration profiles of the uncompensated donors and recombination centers for holes as well as the hole diffusion lengths more uniform over the CVD layer. According to CL and secondary ion mass-spectroscopy measurements the presence of aluminum as an impurity was detected in initial commercial wafers, as well as having LPE and CVD epitaxial layers. Forward current...

Resonant optical properties of AlGaAs/GaAs multiple-quantum-well based Bragg structure at the second quantum state

An AlGaAs/GaAs multiple-quantum-well based resonant Bragg structure was designed to match the optical Bragg resonance with the exciton-polariton resonance at the second quantum state in the GaAs quantum wells. The sample structure with 60 periods of AlGaAs/GaAs quantum wells was grown on a semi-insulating GaAs substrate by molecular beam epitaxy. Angle- and temperature-dependent photoluminescence, optical reflectance, and electro-reflectance spectroscopies were employed to study the resonant optical properties of the Bragg structure. Broad and enhanced optical and electro-reflectance features were observed when the Bragg resonance was tuned to the second quantum state of the GaAs quantum well excitons, manifesting a strong light-matter interaction. From the electro-optical experiments, we found the electro-reflectance features related to the transitions of x(e2-hh2) and x(e2-hh1) excitons. The excitonic transition x(e2-hh1), which is prohibited at zero electric field, was allowed by a DC bias due to the b...

Investigation of the Modified Structure of a Quantum Cascade Laser

The process of obtaining a modified structure for quantum cascade lasers is studied; this process includes growth using molecular-beam epitaxy, plasma etching, photolithography with the use of liquid etching, and the formation of special contacts for decreasing losses in the waveguide. The use of a special type of structure makes it possible, even without postgrowth overgrowth with a high-resistivity material, to attain parameters satisfying requirements to heterostructures in high-quality quantum cascade lasers at maximal simplification of the entire preparation process.

Room temperature exciton-polariton resonant reflection and suppressed absorption in periodic systems of InGaN quantum wells

We studied the optical properties of periodic InGaN/GaN multiple quantum well systems with different numbers of periods. A resonant increase in the optical reflection and simultaneous suppression of the optical absorption have been revealed experimentally at room temperature when the Bragg and exciton resonances were tuned to each other. Numerical modeling with a single set of parameters gave a quantitatively accurate fit of the experimental reflection and transmission spectra in a wide wavelength range and various angles of the light incidence. The model included both exciton resonance and non-resonant band-to-band transitions in the InGaN quantum wells, as well as Rayleigh light scattering in the GaN buffer layer. The analysis also involved x-ray diffraction and photoluminescence data. It allowed us to determine the key parameters of the structure. In particular, the radiative broadening of the InGaN QW excitons was evaluated as 0.20 ± 0.02 meV.

Enhanced room-temperature 3.5 µm photoluminescence in stress-balanced metamorphic In(Sb,As)/In(Ga,Al)As/GaAs quantum wells

In this Letter, we report on the design optimization of metamorphic InSb/InAs/In(Ga,Al)As/GaAs heterostructures with type-II-in-type-I quantum well (QW) active regions, aimed at the enhancement of their room-temperature photoluminescence (PL). The strong influence of the design of the convex-graded metamorphic buffer layer (MBL) and the value of the MBL inverse step in the range from 2 to 14 mol % In on stresses in such heterostructures, as well as their PL intensity, are discussed. The optimized metamorphic In(Sb,As)/In0.63Ga0.37As/In0.75Al0.25As/MBL/GaAs structure with the inverse step of 10 mol % demonstrates 3.2–3.5 µm mid-IR PL intensity quenching from liquid-nitrogen to room temperature by a factor of 12.

Optical Properties of AlGaAs/GaAs Resonant Bragg Structure at the Second Quantum State

Photoluminescence, optical reflectance and electro-reflectance spectroscopies were employed to study an AlGaAs/GaAs multiple-quantum-well based resonant Bragg structure, which was designed to match optical Bragg resonance with the exciton-polariton resonance at the second quantum state in the GaAs quantum wells. The structure with 60 periods of AlGaAs/GaAs quantum wells was grown on a semi-insulating substrate by molecular beam epitaxy. Broad and enhanced optical and electro-reflectance features were observed when the Bragg resonance was tuned to the second quantum state of the GaAs quantum well excitons manifesting an enhancement of the light-matter interaction under double-resonance conditions. By applying an alternating electric field, we revealed electro-reflectance features related to the x(e2-hh2) and x(e2-hh1) excitons. The excitonic transition x(e2-hh1), which is prohibited at zero electric field, was allowed by a DC bias due to brake of symmetry and increased overlap of the electron and hole wave functions caused by electric field.

Template Synthesis of Monodisperse Spherical Nanocomposite SiO2/GaN:Eu3+ Particles

A nanocomposite in the form of monodisperse spherical mesoporous silica particles (mSiO2) filled with GaN:Eu3+ is synthesized by the template method. The method is based on the capillary impregnation of pores of mSiO2 particles with a melt of crystal hydrates of gallium and europium (0.22 wt %) nitrates, followed by thermal decomposition and ammonia treatment. It is shown that nanocomposite particles contain hexagonal GaN:Eu3+, are of spherical shape, monodisperse and do not coalesce with each other. The photoluminescence spectra of the mSiO2/GaN:Eu3+ particles show a group of lines characteristic of intracenter transitions in Eu3+.

InAlN/AlN/GaN heterostructures for high electron mobility transistors

The results of development of InAlN/AlN/GaN heterostructures, grown on sapphire substrates by metal-organic chemical vapour deposition, and high electron mobility transistors (HEMTs) based on them are presented. The dependencies of the InAlN/AlN/GaN heterostructure properties on epitaxial growth conditions were investigated. The optimal indium content and InAlN barrier layer thicknesses of the heterostructures for HEMT s were determined. The possibility to improve the characteristics of HEMTs by in-situ passivation by Si3N4 thin protective layer deposited in the same epitaxial process was demonstrated. The InAlN/AlN/GaN heterostructure grown on sapphire substrate with diameter of 100 mm were obtained with sufficiently uniform distribution of sheet resistance. The HEMTs with saturation current of 1600 mA/mm and transconductance of 230 mS/mm are demonstrated.

Phase Transformations in Non-stoichiometric GaAs with Sb and P Doping

We investigate the phase transformation in non-stoichiometric GaAs films, which are doped with group V isovalent impurities, namely Sb and P. In contrast to Al and In atoms of group III, group V atoms may not only form substitutional alloys with the GaAs matrix, but also can be dissolved in As precipitates. Our experimental study based on transmission electron microscopy, x-ray diffraction and optical characterizations revealed an opposite impact of the P and Sb alloying on the nucleation, growth and coarsening of the second phase. While Sb enhances the precipitation rate, P retards it. Delta-doping with Sb causes two-dimensional precipitation, whereas such doping with P does not result in heterogeneous nucleation. The microstructure and strains have been found to be different around nanoinclusions in the Sb-doped and P-doped materials, indicating different thermodynamics and kinetics of segregation of the two isovalent impurities in As nanoclusters. We analyze the observed phenomena in terms of thermodynamic and kinetic models taking into account the underlying phase equilibriums and diffusion mechanisms.