Mark C. Rzadca
Eastman Kodak Company
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Featured researches published by Mark C. Rzadca.
SPIE's 1995 Symposium on OE/Aerospace Sensing and Dual Use Photonics | 1995
Sinan Batman; Edward R. Dougherty; Mark C. Rzadca; Joseph O. Chapa
As introduced by Matheron, granulometries depend on a single sizing parameter for each structuring element forming the filter. The size distributions resulting from these granulometries have been used successfully to classify texture by using as features the moments of the normalized size distribution. The present paper extends the concept of granulometry in such a way that each structuring element has its own sizing parameter and the resulting size distribution is multivariate. Classification is accomplished by taking either the Walsh or wavelet transform of the multivariate size distribution, obtaining a reduced feature set by applying the Karhunen-Loeve transform to decorrelate the Walsh or wavelet features, and classifying the textures via a Gaussian maximum-likelihood classifier.
Archive | 2006
Yongchun Lee; George Anthony Hadgis; Mark C. Rzadca
Archive | 2012
Samuel Chen; Mark C. Rzadca
Archive | 2005
George Thomas Mccollough; Mark C. Rzadca; David C. Press; James Stephen Honan
Archive | 2011
Thomas D. Pawlik; Mark C. Rzadca; Thomas F. Powers
Archive | 2014
Samuel Chen; Mark C. Rzadca; James M. Enge
Archive | 2012
Mark C. Rzadca; Thomas D. Pawlik
Archive | 2012
Thomas F. Powers; Mark C. Rzadca; Thomas D. Pawlik
Archive | 2010
Thomas F. Powers; Mark C. Rzadca; Thomas D. Pawlik
Archive | 2007
Yongchun Lee; George Anthony Hadgis; Mark C. Rzadca