Mark E. Parker
National Institute of Standards and Technology
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Featured researches published by Mark E. Parker.
conference on precision electromagnetic measurements | 1996
Nile M. Oldham; Mark E. Parker; B. Bell; Svetlana Avramov-Zamurovic
Low-frequency errors of thermal voltage converters are described and estimated using a circuit model that includes easily measured parameters. A digitally synthesized source is used to confirm the estimated ac-dc differences in the 0.01 Hz to 40 Hz range.
conference on precision electromagnetic measurements | 1996
Nile M. Oldham; Mark E. Parker; Bryan Cristopher Waltrip; Svetlana Avramov-Zamurovic
A step down procedure is described for establishing voltage standards in the 1 mV to 100 mV range at frequencies between 10 Hz and 1 MHz. The step down employs low voltage thermal voltage converters and micropotentiometers. Techniques are given for measuring input impedance and calculating loading errors.
IEEE Transactions on Instrumentation and Measurement | 1987
Nile M. Oldham; Mark E. Parker; Albert M. Young; Alan G. Smith
An automatic system for calibrating high-accuracy ac voltmeters and calibrators is described. The system is based on traditional coaxial, thermal voltage converters to provide ac voltage measurement uncertainties of 5–20 ppm in the audiofrequency range and 5–250 ppm over the full range from 10 Hz to 1 MHz at voltages between 0.5–600 V. Lower levels (0.01–0.5 V) are realized using wideband inductive dividers. Specialized hardware and measurement techniques make it possible to achieve these uncertainties in test periods of approximately 1 min. Random errors introduced by the measurement system are typically less than 2 ppm (one standard deviation).
instrumentation and measurement technology conference | 1999
Nile M. Oldham; Mark E. Parker
A new method of providing traceability for multifunction calibrators (sources used to calibrate digital multimeters) is described. The method requires a transportable digital multimeter that links a reference calibrator to the calibrator under test and an Internet connection to share test procedures, software, and data. Digital cameras and microphones at both ends enhance communication for troubleshooting and collaboration.
IEEE Transactions on Instrumentation and Measurement | 1998
Svetlana Avramov-Zamurovic; Nile M. Oldham; Mark E. Parker; Bryan C. Waltrip
Low-frequency errors of thin-film multijunction thermal voltage converters are estimated using a simple model based on easily measured parameters. The model predictions are verified by measuring the converters frequency characteristic using a digitally synthesized source.
conference on precision electromagnetic measurements | 1994
Nile M. Oldham; P. S. Hetrick; Mark E. Parker
A digitally synthesized source (DSS) designed to calibrate low-frequency (0.1 Hz to 1 kHz) digital voltmeters and thermal converters is described. The DSS output voltage, frequency, and waveform are programmable over the General Purpose Interface Bus (GPIB). The rms value of the output voltage is calculated, with an uncertainty of less than 5 ppm, by measuring the dc voltage of each of the steps used to create the waveform.<<ETX>>
instrumentation and measurement technology conference | 1997
Svetlana Avramov-Zamurovic; Nile M. Oldham; Mark E. Parker; Bryan Cristopher Waltrip
Low frequency errors of thin-film multijunction thermal voltage converters are estimated using a simple model based on easily measured parameters. The model predictions are verified by measuring the converters frequency characteristic using a digitally synthesized source.
IEEE Transactions on Instrumentation and Measurement | 2003
Giancarlo Marullo-Reedtz; Roberto Cerri; Isabelle Blanc; Ove Gunnarsson; Jonathan M. Williams; Félix Raso; Kyu-Tae Kim; Robert B. Frenkel; Zhang Xiuzeng; A. Katkov; Ronald F. Dziuba; Mark E. Parker; Barry M. Wood; Laurie Christian; Eddie Tarnow; Surender K. Mahajan; Ajeet Singh; Y. Sakamoto
Archive | 1992
Bryan C. Waltrip; Mark E. Parker; Nile M. Oldham; Barry A. Bell
National Conference of Standards Laboratories, Toronto, Ontario (CA), 07/16/2000--07/20/2000 | 2000
Lisa A. Bunting Baca; Leonard E. Duda Jr.; Russell M. Walker; Nile M. Oldham; Mark E. Parker