Marlene Patino

Secondary electron emission from plasma-generated nanostructured tungsten fuzz

Recently, several researchers [e.g., Yang et al., Sci. Rep. 5, 10959 (2015)] have shown that tungsten fuzz can grow on a hot tungsten surface under bombardment by energetic helium ions in different plasma discharges and applications, including magnetic fusion devices with plasma facing tungsten components. This work reports the direct measurements of the total effective secondary electron emission (SEE) from tungsten fuzz. Using dedicated material surface diagnostics and in-situ characterization, we find two important results: (1) SEE values for tungsten fuzz are 40%–63% lower than for smooth tungsten and (2) the SEE values for tungsten fuzz are independent of the angle of the incident electron. The reduction in SEE from tungsten fuzz is most pronounced at high incident angles, which has important implications for many plasma devices since in a negative-going sheath the potential structure leads to relatively high incident angles for the electrons at the plasma confining walls. Overall, low SEE will creat...

Analysis of secondary electron emission for conducting materials using 4-grid LEED/AES optics

A facility utilizing 4-grid optics for LEED/AES (low energy electron diffraction/Auger electron spectroscopy) was developed to measure the total secondary electron yield and secondary electron energy distribution function for conducting materials. The facility and experimental procedure were validated with measurements of 50–500 eV primary electrons impacting graphite. The total yield was calculated from measurements of the secondary electron current (i) from the sample and (ii) from the collection assembly, by biasing each surface. Secondary electron yield results from both methods agreed well with each other and were within the spread of previous results for the total yield from graphite. Additionally, measurements of the energy distribution function of secondary electrons from graphite are provided for a wider range of incident electron energies. These results can be used in modeling plasma-wall interactions in plasmas bounded by graphite walls, such as are found in plasma thrusters, and divertors and limiters of magnetic fusion devices.

Characterization of xenon ion and neutral interactions in a well-characterized experiment

Interactions between fast ions and slow neutral atoms are commonly dominated by charge-exchange and momentum-exchange collisions, which are important to understanding and simulating the performance and behavior of many plasma devices. To investigate these interactions, this work developed a simple, well-characterized experiment that accurately measures the behavior of high energy xenon ions incident on a background of xenon neutral atoms. By using well-defined operating conditions and a simple geometry, these results serve as canonical data for the development and validation of plasma models and models of neutral beam sources that need to ensure accurate treatment of angular scattering distributions of charge-exchange and momentum-exchange ions and neutrals. The energies used in this study are relevant for electric propulsion devices ∼1.5 keV and can be used to improve models of ion-neutral interactions in the plume. By comparing these results to both analytical and computational models of ion-neutral interactions, we discovered the importance of (1) accurately treating the differential cross-sections for momentum-exchange and charge-exchange collisions over a large range of neutral background pressures and (2) properly considering commonly overlooked interactions, such as ion-induced electron emission from nearby surfaces and neutral-neutral ionization collisions.Interactions between fast ions and slow neutral atoms are commonly dominated by charge-exchange and momentum-exchange collisions, which are important to understanding and simulating the performance and behavior of many plasma devices. To investigate these interactions, this work developed a simple, well-characterized experiment that accurately measures the behavior of high energy xenon ions incident on a background of xenon neutral atoms. By using well-defined operating conditions and a simple geometry, these results serve as canonical data for the development and validation of plasma models and models of neutral beam sources that need to ensure accurate treatment of angular scattering distributions of charge-exchange and momentum-exchange ions and neutrals. The energies used in this study are relevant for electric propulsion devices ∼1.5 keV and can be used to improve models of ion-neutral interactions in the plume. By comparing these results to both analytical and computational models of ion-neutral int...

Angular, temperature, and impurity effects on secondary electron emission from Ni(110)

The secondary electron emission from a temperature-controlled Ni(110) sample was examined for 50–1500 eV electrons impacting at 0°–35°, 50°, and 78°. Measurements showed a non-cosine dependence on an electron incidence angle: the yield has a maximum at 0°, minima at ±12°, and increases at larger angles up to 35°. This trend in angular dependence is characteristic of single crystal materials and is due to increased secondary electron generation when primary electrons are directed along a close-packed direction. For example, compared to polycrystalline nickel, the yield for Ni(110) from primary electrons at 0° (i.e., along the [110] direction) is up to 36% larger. Additionally, secondary electron yields are highly sensitive to incident electron energy (most notably between 0 and 500 eV) and to the presence of adsorbed carbon monoxide [with an up to 25% decrease compared to clean Ni(110)]. However, yields are independent of sample temperature between 300 and 600 K and of exposure to deuterium ions leading to formation of subsurface hydrogen. These results reaffirm the unique secondary electron emission properties of single crystals materials and highlight the importance of crystal orientation. Results are important for plasma-enhanced chemistry applications that utilize Ni(110) catalysts, since larger secondary electron emission may facilitate reactions of adsorbed species.The secondary electron emission from a temperature-controlled Ni(110) sample was examined for 50–1500 eV electrons impacting at 0°–35°, 50°, and 78°. Measurements showed a non-cosine dependence on an electron incidence angle: the yield has a maximum at 0°, minima at ±12°, and increases at larger angles up to 35°. This trend in angular dependence is characteristic of single crystal materials and is due to increased secondary electron generation when primary electrons are directed along a close-packed direction. For example, compared to polycrystalline nickel, the yield for Ni(110) from primary electrons at 0° (i.e., along the [110] direction) is up to 36% larger. Additionally, secondary electron yields are highly sensitive to incident electron energy (most notably between 0 and 500 eV) and to the presence of a...

Electron emission from carbon velvet due to incident xenon ions

We present measurements of the ion-induced electron emission from carbon velvet. The results from carbon velvet with high aspect ratio vertical fibers (6.8 μm diameter and 2.6 mm length) show a more than 60% reduction in ion-induced electron emission for normal incident xenon ions over the entire ion incident energy investigated (i.e., 500–2000 eV) when compared to graphite. This is important for plasma-facing surfaces that are exposed to large fluxes of energetic ions, such as beam dumps and chamber walls used to control facility effects in plasma-thruster ground tests.