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Publication
Featured researches published by Masashi Nakao.
Applied Physics Letters | 1997
Hideki Masuda; Haruki Yamada; Masahiro Satoh; Hidetaka Asoh; Masashi Nakao; Toshiaki Tamamura
The development of the ordered channel array in the anodic porous alumina was initiated by the textured pattern of the surface made by the molding process, and growth of an almost defect-free channel array can be achieved throughout the textured area. The long-range-ordered channel array with dimensions on the order of millimeters with a channel density of 1010u2002cm−2 was obtained, and the aspect ratio was over 150. The master for molding could be used many times, which makes it possible to overcome problems in the conventional nanolithographic technique, such as low through-put and high cost.
Proceedings of SPIE, the International Society for Optical Engineering | 2005
Masashi Nakao; Shiyoshi Yokoyama; Hideki Masuda
We have developed nanoimprint technology to fabricate functional optical components. The future and usage of various molds for nanoimprint are described and their patterning examples are shown. Several applications of the nanoimprint technology are introduced; anti-reflection surface structure by using graded convex and concave patterns, extremely low threshold dye laser by 2-dimensional photonic crystals infiltrated with a gain medium, and various semiconductor nanostructures being used for functional optical devices. Nanoimprint is key technology to realize these components.
Applied Physics Letters | 1993
Masaya Notomi; Masashi Nakao; Toshiaki Tamamura
By means of atomic force microscopy, we have directly measured, for the first time, size fluctuations in InGaAs/InP quantum wire structures fabricated by e‐beam lithography and reverse‐mesa wet etching. Based on a statistical analysis of the measured data, we discuss the standard deviation of the lateral size of wire structures. The results clearly indicate that the size fluctuations in the wire patterns are predominantly small compared to those in the original mask patterns. This is attributed to the formation of crystallographic facet during the reverse‐mesa wet etching.
Advanced Materials | 2001
Hideki Masuda; Hidetaka Asoh; Mitsuo Watanabe; Kazuyuki Nishio; Masashi Nakao; Toshiaki Tamamura
Archive | 1997
Hideki Masuda; Masashi Nakao; Toshiaki Tamamura
Archive | 1997
Hideki Masuda; Masashi Nakao; Toshiaki Tamamura; 正史 中尾; 敏昭 玉村; 秀樹 益田
Archive | 1999
Hideki Masuda; Masashi Nakao; Matsuyuki Ogasawara; Toshiaki Tamamura; Atsushi Yokoo; 正史 中尾; 松幸 小笠原; 篤 横尾; 敏昭 玉村; 秀樹 益田
Archive | 2001
Hideki Masuda; Masashi Nakao; Masaya Notomi; Hiroyuki Suzuki; Toshiaki Tamamura; Atsushi Yokoo; 正史 中尾; 篤 横尾; 敏昭 玉村; 秀樹 益田; 雅也 納富; 博之 鈴木
Archive | 2002
Masashi Nakao; 正史 中尾
Archive | 2005
Shiyoshi Yokoyama; Tatsuo Nakahama; Shinro Mashiko; Masashi Nakao; Motohiro Yamada; Kazuyuki Nishio; Hideki Masuda; Esther Baumann; Fabrizio R. Giorgetta; Daniel Hofstetter; Hai Lu; Xin Chen; William J. Schaff; L. F. Eastman; S. Golka; W. Schrenk; G. Strasser; Takehiro Fukushima; Tomoko Tanaka; Takahisa Harayama; Sergei Bereznev; E. Mellikov; Christophe Hubert; Céline Fiorini-Debuisschert; Luciano F. Rocha; Paul Raimond; Hongwen Ren; Yi-Hsin Lin; Chien-Hui Wen; Shin-Tson Wu