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Featured researches published by Masashi Nakao.


Applied Physics Letters | 1997

Highly ordered nanochannel-array architecture in anodic alumina

Hideki Masuda; Haruki Yamada; Masahiro Satoh; Hidetaka Asoh; Masashi Nakao; Toshiaki Tamamura

The development of the ordered channel array in the anodic porous alumina was initiated by the textured pattern of the surface made by the molding process, and growth of an almost defect-free channel array can be achieved throughout the textured area. The long-range-ordered channel array with dimensions on the order of millimeters with a channel density of 1010u2002cm−2 was obtained, and the aspect ratio was over 150. The master for molding could be used many times, which makes it possible to overcome problems in the conventional nanolithographic technique, such as low through-put and high cost.


Proceedings of SPIE, the International Society for Optical Engineering | 2005

Nanoimprint technology for application to photonic devices

Masashi Nakao; Shiyoshi Yokoyama; Hideki Masuda

We have developed nanoimprint technology to fabricate functional optical components. The future and usage of various molds for nanoimprint are described and their patterning examples are shown. Several applications of the nanoimprint technology are introduced; anti-reflection surface structure by using graded convex and concave patterns, extremely low threshold dye laser by 2-dimensional photonic crystals infiltrated with a gain medium, and various semiconductor nanostructures being used for functional optical devices. Nanoimprint is key technology to realize these components.


Applied Physics Letters | 1993

Direct measurement of size fluctuation in reverse‐mesa etched quantum wire structures by the atomic force microscope

Masaya Notomi; Masashi Nakao; Toshiaki Tamamura

By means of atomic force microscopy, we have directly measured, for the first time, size fluctuations in InGaAs/InP quantum wire structures fabricated by e‐beam lithography and reverse‐mesa wet etching. Based on a statistical analysis of the measured data, we discuss the standard deviation of the lateral size of wire structures. The results clearly indicate that the size fluctuations in the wire patterns are predominantly small compared to those in the original mask patterns. This is attributed to the formation of crystallographic facet during the reverse‐mesa wet etching.


Advanced Materials | 2001

Square and Triangular Nanohole Array Architectures in Anodic Alumina

Hideki Masuda; Hidetaka Asoh; Mitsuo Watanabe; Kazuyuki Nishio; Masashi Nakao; Toshiaki Tamamura


Archive | 1997

Method of manufacturing porous anodized alumina film

Hideki Masuda; Masashi Nakao; Toshiaki Tamamura


Archive | 1997

Formation of porous anodized alumina film

Hideki Masuda; Masashi Nakao; Toshiaki Tamamura; 正史 中尾; 敏昭 玉村; 秀樹 益田


Archive | 1999

Formation method for fine pattern of semiconductor surface

Hideki Masuda; Masashi Nakao; Matsuyuki Ogasawara; Toshiaki Tamamura; Atsushi Yokoo; 正史 中尾; 松幸 小笠原; 篤 横尾; 敏昭 玉村; 秀樹 益田


Archive | 2001

Photonic crystal optical element and its producing method

Hideki Masuda; Masashi Nakao; Masaya Notomi; Hiroyuki Suzuki; Toshiaki Tamamura; Atsushi Yokoo; 正史 中尾; 篤 横尾; 敏昭 玉村; 秀樹 益田; 雅也 納富; 博之 鈴木


Archive | 2002

PHOTOLUMINESCENCE MEASURING APPARATUS AND Si FILTER

Masashi Nakao; 正史 中尾


Archive | 2005

LASERS, OPTICS, AND OPTOELECTRONICS 191101 Photonic crystal templates for organic solid-state lasers (3 pages)

Shiyoshi Yokoyama; Tatsuo Nakahama; Shinro Mashiko; Masashi Nakao; Motohiro Yamada; Kazuyuki Nishio; Hideki Masuda; Esther Baumann; Fabrizio R. Giorgetta; Daniel Hofstetter; Hai Lu; Xin Chen; William J. Schaff; L. F. Eastman; S. Golka; W. Schrenk; G. Strasser; Takehiro Fukushima; Tomoko Tanaka; Takahisa Harayama; Sergei Bereznev; E. Mellikov; Christophe Hubert; Céline Fiorini-Debuisschert; Luciano F. Rocha; Paul Raimond; Hongwen Ren; Yi-Hsin Lin; Chien-Hui Wen; Shin-Tson Wu

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Hideki Masuda

Tokyo Metropolitan University

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Hidetaka Asoh

Tokyo Metropolitan University

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Kazuyuki Nishio

Tokyo University of Technology

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A. Ozawa

University of Tsukuba

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Haruki Yamada

Tokyo Metropolitan University

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Hiroyuki Suzuki

Nippon Telegraph and Telephone

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Masahiro Satoh

Tokyo Metropolitan University

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