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Featured researches published by Menachem Levanoni.


Ibm Journal of Research and Development | 1994

ABC: a better control for manufacturing

Jerome M. Kurtzberg; Menachem Levanoni

ABC is a generic methodology to improve the quality of manufacturing. It can optimize operation of a single process or an entire factory to meet or exceed product specifications. ABC is based on three nets which continually interact o model processes and to provide local process control and global product optimization. Significant process variables are identified, evaluated, and ranked according to their contributions to product quality. Process performance, which determines product quality, is characterized by a sensitive parameter, the Q-factor, which is used for local control and for global optimization. Real-time response maps capture process behavior and identify current status, improved operating points, and expected improvement in relation to design targets. ABC continually compensates for off-specification manufacturing steps by feedforward-andfeedback corrective actions which keep the product on target. ABC also evaluates and ranks the effects of non-numeric manufacturing variables, such as specific tools and vendors, on product quality. Total quality control can be achieved by optimizing all variables, both sensor-based and non-numeric, which control the product. Some of ABC’s capabilities are demonstrated in a multistep fabrication of a semiconductor capacitor in which the electrical properties of the product are optimized by controlling the individual chemical process steps. ABC’s capacity to minimize scrap and rework by compensating for out-of-control conditions is demonstrated in this example. A functional subset of ABC currently exists as a menu-driven tool, implemented in APW@ on VM/CMS for mainframe computers and in the C language for workstation platforms: RS/6000 running under AIX@ and PS/2@ under OS/2@. ABC is available, in the workstation version, as an IBM Program Offering under the name QuMAP-A Better Control, and is currently used in the semiconductor, pharmaceutical, chemical, and consumer goods industries.


Archive | 1998

Method and system for model-based clustering and signal-bearing medium for storing program of same

Ying Tat Leung; Menachem Levanoni; Sanjay Elathur Ramaswamy


Archive | 1995

Mechanism and architecture for manufacturing control and optimization

Jerome M. Kurtzberg; Menachem Levanoni


Archive | 1984

Ultra-fast photometric instrument

Jean-Claude Chastang; Walter William Hildenbrand; Menachem Levanoni


Archive | 1999

Method and apparatus suitable for optimizing an operation of a self-guided vehicle

Jerome M. Kurtzberg; Menachem Levanoni


Archive | 1997

Method and apparatus for testing the integrity of computer security alarm systems

Jerome M. Kurtzberg; Menachem Levanoni


Archive | 1999

Adaptive computer display screen window

Jerome M. Kurtzberg; Menachem Levanoni


Archive | 1995

Optimizing functional operation in manufacturing control

Jerome M. Kurtzberg; Menachem Levanoni


Archive | 1995

Evaluation and ranking of manufacturing line non-numeric information

Jerome M. Kurtzberg; Menachem Levanoni


Archive | 1998

Dynamic resource allocation for user management in multi-processor time shared computer systems

Jerome M. Kurtzberg; Menachem Levanoni

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