Michael Loeken
Philips
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Featured researches published by Michael Loeken.
SPIE's 27th Annual International Symposium on Microlithography | 2002
Joseph Pankert; Klaus Bergmann; Jürgen Klein; Willi Neff; Oliver Rosier; Stefan Seiwert; Christopher Smith; Rolf Apetz; Jeroen Jonkers; Michael Loeken; Guenther Hans Derra
The paper describes the physical properties and recent technical advances of the hollow cathode triggered pinch device (HCT) for the generation of EUV radiation. In previous publications we have demonstrated continuous operation of the untriggered device at 1 kHz in pure Xe. The newer generations operate with a triggering facility which allows a wider parameter space under which stable operation is possible. Repetition frequencies of up to 4 kHz could be demonstrated. Many of the experiments are performed in repetitive bursts of variable lengths and spacing. This allows also to demonstrate that there is only little transient behavior upon switching on and off the source. Conversion efficiencies into the 2 percent frequency band around 13.5 nm are about 0.4 percent in 2p, comparable to the values reported from other groups. Another important parameter is the size of the light emitting region. Here we have studied the influence of electrode geometry and flow properties on the size, to find a best match to the requirements of the collection optics. A major problem for the design of a complete wafer illumination system is the out-of-band portion of the radiation. Especially the DUV fraction of the source spectrum is a concern because it is also reflected to some extend by the Mo-Si multilayer mirrors. We show that the source has a low overall non-EUV part of the emission. In particular, it is demonstrated that there is very little DUV coming out of the usable source volume, well below the specified level.
Emerging Lithographic Technologies VIII | 2004
Joseph Pankert; Klaus Bergmann; Juergen Klein; Willi Neff; Oliver Rosier; Stefan Seiwert; Christopher Smith; Sven Probst; Dominik Vaudrevange; Guido Siemons; Rolf Apetz; Jeroen Jonkers; Michael Loeken; Guenther Hans Derra; Thomas Kruecken; Peter Zink
The paper describes progress of the Philips’ hollow cathode triggered (HCT) gas discharge EUV source. The program has been focussed on three major areas: (1) Studying the basic physics of ignition, pinch formation and EUV generation. The paper reports on progress in this area and particularly describes the underlying atomic physics both for Xe and Sn. (2) Discharge based on Sn. Results on overall efficiency more than 5 times the Xe efficiency are reported as well as high frequency operation up to 6.5 kHz. This system shows all the necessary ingredients for scaling to production power levels. (3) Integration of the Xe source in an alpha tool. Results on integration issues like electrode life time, collector life time and dose control will be presented.
Emerging Lithographic Technologies IX | 2005
Joseph Pankert; Rolf Apetz; Klaus Bergmann; Guenther Hans Derra; Maurice Janssen; Jeroen Jonkers; Jürgen Klein; Thomas Kruecken; Andreas List; Michael Loeken; Christof Metzmacher; Willi Neff; Sven Probst; Ralph Prümmer; Oliver Rosier; Stefan Seiwert; Guido Siemons; Dominik Vaudrevange; Dirk Wagemann; Achim Weber; Peter Zink; Oliver Zitzen
Archive | 2006
Willi Neff; Michael Loeken
Archive | 2006
Joseph Pankert; Klaus Bergmann; Rolf Wester; Jürgen Klein; Willi Neff; Oliver Rosier; Stefan Seiwert; Christopher Smith; Sven Probst; Dominik Vaudrevange; Guido Siemons; Rolf Apetz; Michael Loeken; Günther Hans Derra; Jeroen Jonkers; Thomas Krücken; Peter Zink
Archive | 2005
Michael Loeken; Jakob Willi Neff; Juergen Klen; Sven Probst
Archive | 2005
Michael Loeken; Jakob Willi Neff; Juergen Klein; Sven Probst
Archive | 2004
Jürgen Klein; Michael Loeken; Willi Neff; Sven Probst
Archive | 2001
Juergen Klein; Stefan Seiwert; Willi Dr Neff; Klaus Dr Bergmann; Joseph Pankert; Michael Loeken
Archive | 2001
Juergen Klein; Stefan Seiwert; Willi Dr Neff; Klaus Dr Bergmann; Joseph Pankert; Michael Loeken