Michael N. Granieri

Synthetic Instrumentation: The road ahead

This paper provides the reader with an overview of current Synthetic Instrumentation technology and a discussion of the probable future direction of this interesting and disruptive technology. The paper opens with a brief introduction and technical overview of Synthetic Instrumentation and then presents a discourse on the primary attributes of Synthetic Instrumentation. Having reviewed the basics of Synthetic Instrumentation technology, the paper then goes on to discuss the fundamental classes/types of Synthetic Instruments (SI), their associated attributes, and typical types of users associated with these SI classes. The authors then discuss how Synthetic Instrumentation fits in the current Test and Measurement (T&M) application continuum. The paper concludes with a discussion on the possible disruptive impact of this emerging technology on the Test and Measurement (T&M) marketplace and the key technologies that will have a future impact on the continuing evolution of Synthetic Instrumentation.

System engineering considerations and methodology for effecting a cohesive functional/parametric testing strategy

The authors consider RFI (ready for issue) methodologies and techniques that can be used to effect a cohesive functional/parametric testing strategy. A number of functional/parametric testing scenarios are discussed from the viewpoint of assessing diagnostic accuracy, functional/parametric test correlation, test data maturation, and testing throughput. It is concluded that the key to establishing an effective and cohesive functional/parametric testing strategy is diagnostic information management within the context of the concurrent engineering process. Diagnostic information management enables more effective RFI testing to be performed at all levels of test. Specifically, diagnostic information management is the key to effecting more efficient (i.e. faster test times) and accurate (i.e. fault isolation resolution) test program sets because it enables the test strategies to capture the best features of both functional and parametric testing and use them in a complementary manner.<<ETX>>

A flexible family of PXI RF/MW Down Converter modules

This paper is in support of a recent small business innovative research (SBIR) phase II development effort. The objective of the effort was to design and develop a family of radio frequency (RF) and microwave (MW) down converter modules in a small form factor called PXI (PCI extension for instrumentation) for use in a synthetic instrument (SI) measurement context over a target frequency range of 100 KHz to 26.5 GHz. At the present time the current state of the art for RF/MW measurement instrumentation in a PXI form factor is limited to approximately 6 GHz. The paper opens with an overview of the subject and scope of this development initiative. The paper then goes on to describe the purpose and functionality of each of the down converter modules. The authors then describe how the modules can be configured into any number of seven (7) SI solution configurations, with particular emphasis on the 100 KHz - 26.5 GHz configuration. The paper then concludes with a summary overview and conclusions arrived at by the authors as a result of this developmental effort, as well as a future prognosis for this technology.

RF/MW down converter development in a PXI form factor

This paper is in support of a recent Phase Matrix, Inc. (PMI) Phase I Small Business Innovative Research (SBIR) investigative study. The objective of this SBIR initiative was to assess the feasibility of developing a radio frequency/microwave (RF/MW) down converter in a small form factor format called PXI (PCI Extension for Instrumentation) for use in a synthetic instrument measurement context over a target frequency range of DC to 26.5 GHz. The paper opens with an introductory overview of the subject, purpose and scope of this project initiative. The paper then provides the reader background /introductory information on the significance of the problem being addressed by this research, an overview of synthetic instrumentation technology, and addresses the challenges and opportunities afforded by employing PXI technology in the context of a RF/MW SI application. The paper then describes the technical objectives of the Phase I research and the associated issues which needed to be resolved in order to establish project feasibility. In the summary of results section of the paper, the authors provide an overview of the PXI 3U functional partitioning approach adopted as a result of their investigative studies and provides a brief discussion of a family of five (5) down converter modules which can be configured into various configurations for dual use (commercial & military) application. The paper then concludes with a summary overview of the conclusions arrived at as a result of the authors* Phase I feasibility investigations as well as Phase II (prototype development) next steps.

Diagnostician on-a-chip (DOC)

This paper describes the principal concepts and initial implementation of an innovative approach for embedding a diagnostic reasoning capability onto microcontroller. The approach is predicated upon the use of an automated concurrent engineering tool set that is utilized to develop a diagnostic knowledge base which is subsequently incorporated into microcontrollers diagnostic run-time system. Examples of centralized and distributed architectures utilizing the subject approach are described.<<ETX>>