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Dive into the research topics where Michael Reichling is active.

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Featured researches published by Michael Reichling.


Applied Physics A | 1994

The Influence of Thermal Diffusion on Laser Ablation of Metal Films

E. Matthias; Michael Reichling; J. Siegel; O. W. Käding; S. Petzoldt; H. Skurk; P. Bizenberger; E. Neske

Single-shot ablation thresholds of nickel and gold films in the thickness range from 50 nm to 7 μm have been measured for 14 ns laser pulses at 248 nm, using photoacoustic shock wave detection in air. The metal films were deposited on fused silica substrates. The ablation threshold was found to increase linearly with film thickness up to the thermal diffusion length of the film. Beyond this point it remains independent of film thickness. The proportionality between threshold fluence and thickness allows the prediction of ablation thresholds of metal films from the knowledge of their optical properties, evaporation enthalpies and thermal diffusivities. Physically it proves that ablation is driven by the energy density determined by the thermal diffusion length. A simple thermodynamic model describes the data well. Thermal diffusivities, an essential input for this model, were measured using the technique of transient thermal gratings. In addition, the substrate dependence of the ablation threshold was investigated for 150 nm Ni films.


Review of Scientific Instruments | 1997

Thermal conductivity of thin metallic films measured by photothermal profile analysis

G. Langer; J. Hartmann; Michael Reichling

Thermal conductivity of nickel and gold films on quartz (thickness 0.4–8 μm) was measured by a modulated thermoreflectance technique recording the surface temperature profile. Model calculations predict an optimum frequency for measuring thermal transport within the film. Measurements on films with various thicknesses reveal a thermal conductivity close to the bulk value for nickel while gold films exhibit a reduced conductivity with decreasing film thickness.


Journal of Applied Physics | 1994

Harmonic heat flow in isotropic layered systems and its use for thin film thermal conductivity measurements

Michael Reichling; Henrik Grönbeck

A theoretical model is presented describing harmonic heat flow in a two layer system heated by a modulated Gaussian laser beam. Amplitude and phase of the modulated temperature rise in the layers, as well as in the backing substrate and adjacent atmosphere, are calculated by solving the three‐dimensional heat conduction equation with a source term including exponential absorption of the laser light in one or two layers. Heat conduction is assumed to be isotropic throughout the system, however, a thermal contact resistance between the two layers can be taken into account. Results are presented for single and double layer systems of gold and various dielectric thin film materials on glass substrates. Amplitude and phase of the harmonic temperature variation are calculated either as a function of position in the sample system or at the surface as a function of the laser beam modulation frequency. It is found that both amplitude and phase of the calculated temperature rise exhibit typical thin film features i...


Applied Physics Letters | 1988

Surface laser damage thresholds determined by photoacoustic deflection

S. Petzoldt; A. P. Elg; Michael Reichling; J. Reif; E. Matthias

The technique of intensity dependent photoacoustic probe beam deflection has been applied to the determination of surface damage thresholds. We take advantage of an unambiguous correlation between the degree of laser damage and the energy in the generated acoustic pulse. The high sensitivity of this method, cross checked by measuring scatter losses in reflection, is independent of any surface optical properties. As an example for optical materials, damage thresholds for MgF2 and CaF2 have been determined to be about 1.4 GW/cm2 , and for LiF to be about 0.2 GW/cm2 .


Physical Chemistry Chemical Physics | 2011

Characterizing TiO2(110) surface states by their work function

Andriy Borodin; Michael Reichling

The unreconstructed TiO(2)(110) surface is prepared in well-defined states having different characteristic stoichiometries, namely reduced (r-TiO(2), 6 to 9% surface vacancies), hydroxylated (h-TiO(2), vacancies filled with OH), oxygen covered (ox-TiO(2), oxygen adatoms on a stoichiometric surface) and quasi-stoichiometric (qs-TiO(2), a stoichiometric surface with very few defects). The electronic structure and work function of these surfaces and transition states between them are investigated by ultraviolet photoelectron spectroscopy (UPS) and metastable impact electron spectroscopy (MIES). The character of the surface is associated with a specific value of the work function that varies from 4.9 eV for h-TiO(2), 5.2 eV for r-TiO(2), 5.35 eV for ox-TiO(2) to 5.5 eV for qs-TiO(2). We establish the method for an unambiguous characterization of TiO(2)(110) surface states solely based on the secondary electron emission characteristics. This is facilitated by analysing a weak electron emission below the nominal work function energy. The emission in the low energy cut-off region appears correlated with band gap emission found in UPS spectra and is attributed to localised electron emission through Ti(3+)(3d) states.


Journal of Applied Physics | 1997

Measuring local thermal conductivity in polycrystalline diamond with a high resolution photothermal microscope

J. Hartmann; P. Voigt; Michael Reichling

A photothermal microscope that provides micrometer lateral and submicrometer depth resolution was designed. Thermal conductivity measurements with modulation frequencies up to 12 MHz on single grains in polycrystalline diamond demonstrate its lateral resolution power even for a highly conducting material. Measured conductivities strongly depend on the averaged volume and values up to 2200 W/mK are found in the high frequency limit where the properties inside a grain are sampled. The capability of the instrument to measure thermal parameters on thin films is demonstrated for gold films evaporated on quartz with a thickness ranging from 20 to 1500 nm. Measurements reveal a strong thickness dependence for both thin film conductivity and the contact resistance between film and substrate. Thermal conductivity decreases monotonically from 230 to 30 W/mK whereas the contact resistance rises from 2×10−7 to 8×10−6 m2K/W with decreasing film thickness.


Nanotechnology | 2006

Chemical identification of point defects and adsorbates on a metal oxide surface by atomic force microscopy

Jeppe V. Lauritsen; Adam S. Foster; Georg H. Olesen; M. Christensen; Angelika Kühnle; Stig Helveg; Jens R. Rostrup-Nielsen; Bjerne S. Clausen; Michael Reichling; Flemming Besenbacher

Atomic force microscopy in the non-contact mode (nc-AFM) can provide atom-resolved images of the surface of, in principle, any material independent of its conductivity. Due to the complex mechanisms involved in the contrast formation in nc-AFM imaging, it is, however, far from trivial to identify individual surface atoms or adsorbates from AFM images. In this work, we successfully demonstrate how to extract detailed information about defects and the chemical identity of adsorbates on a metal oxide surface from nc-AFM images. We make use of the observation that the apex of the AFM tip can be altered to expose either a positive or negative tip termination. The complementary set of images recorded with the two tip terminations unambiguously define the ionic sub-lattices and reveal the exact positions of oxygen vacancies and hydroxyl (OH) defects on a TiO(2) surface. Chemical specificity is extracted by comparing the characteristic contrast patterns of the defects with results from comprehensive AFM simulations. Our methodology of analysis is generally applicable and may be pivotal for uncovering surface defects and adsorbates on other transition metal oxides designed for heterogeneous catalysis, photo-electrolysis or biocompatibility.


Journal of Physics: Condensed Matter | 2010

Atomic resolution non-contact atomic force microscopy of clean metal oxide surfaces

Jeppe V. Lauritsen; Michael Reichling

In the last two decades the atomic force microscope (AFM) has become the premier tool for topographical analysis of surface structures at the nanometre scale. In its ultimately sensitive implementation, namely dynamic scanning force microscopy (SFM) operated in the so-called non-contact mode (NC-AFM), this technique yields genuine atomic resolution and offers a unique tool for real space atomic-scale studies of surfaces, nanoparticles as well as thin films, single atoms and molecules on surfaces irrespective of the substrate being electrically conducting or non-conducting. Recent advances in NC-AFM have paved the way for groundbreaking atomic level insight into insulator surfaces, specifically in the most important field of metal oxides. NC-AFM imaging now strongly contributes to our understanding of the surface structure, chemical composition, defects, polarity and reactivity of metal oxide surfaces and related physical and chemical surface processes. Here we review the latest advancements in the field of NC-AFM applied to the fundamental atomic resolution studies of clean single crystal metal oxide surfaces with special focus on the representative materials Al(2)O(3)(0001), TiO(2)(110), ZnO(1000) and CeO(2)(111).


Journal of Physics: Condensed Matter | 2001

Contrast formation in atomic resolution scanning force microscopy on CaF2(111): experiment and theory

C Barth; Adam S. Foster; Michael Reichling; Alexander L. Shluger

We investigate mechanisms of contrast formation in atomic resolution imaging of flat terraces on the CaF2(111) surface with scanning force microscopy operated in the dynamic mode. Experimental results are interpreted with a theory based on atomistic modelling. Experiments reveal characteristic contrast features in the form of triangles that can be explained by theory as being due to the interaction of a positively terminated tip with fluorine ions from two different sublattices. Results for a tip with negative termination are found not to be compatible with experiments. We demonstrate that theory correctly predicts the trend in contrast changes when varying the tip-surface distance but is also limited in quantitative agreement due to the non-ideal atomic structure of real tips. In a distance range where such peculiarities do not play a major role, however, we find good quantitative agreement between theoretical predictions and experimental results. The validity of the comparison between theory and experimental scan lines is discussed in detail using an extensive statistical image analysis.


Nanotechnology | 2007

Structural elements of CeO2(111) surfaces

S Gritschneder; Michael Reichling

The atomic structure of the CeO2(111) surface in different states of cleanliness and reduction is studied in an ultra-high vacuum with high resolution dynamic scanning force microscopy operated in the non-contact mode (nc-AFM) and its structural elements are described by their characteristic contrast patterns. From a synopsis of results we develop a self-consistent interpretation of contrast features that is cross-checked by a systematic variation of experimental conditions and a comparison to previously obtained results. The most common deviations from the regular structure of the stoichiometric surface are surface oxygen vacancies, water adsorbed on top of cerium ions and hydroxide substituting surface oxygen. All of the species are found as single defects as well as in the form of structures composed of several similar defects. We find that water readily adsorbs on the surface and forms hydroxide if oxygen vacancies are present, while both the clean and defective surfaces are rather inert against exposure to molecular oxygen.

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E. Matthias

Free University of Berlin

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Clemens Barth

Centre national de la recherche scientifique

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S. Gogoll

Free University of Berlin

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E. Stenzel

Free University of Berlin

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Jannis Lübbe

University of Osnabrück

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J. Hartmann

Free University of Berlin

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