Michael Rohleder
Freescale Semiconductor
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Publication
Featured researches published by Michael Rohleder.
design, automation, and test in europe | 2011
Allan Crone; Oliver Bringmann; Christophe Chevallaz; Bryan Dickman; Volkan Esen; Michael Rohleder
In the last few years, the industry has seen acceleration in the evolution of verification methodologies. While the industry focus has been on enabling a standard based approach to help todays challenges, one can wonder what is needed to prepare us self for the further verification challenges. The expert panelist will discuss the many aspects of verification methodologies, the requirements and predictions for verification methodologies needed 4–5 years from now on.
Archive | 2015
Michael Rohleder; Stefan Singer; Manfred Thanner
Archive | 2010
Michael Rohleder; Joachim Fader; Frank Lenke; Markus Baumeister
Archive | 2008
Michael Rohleder; Gary Hay; Stephan Mueller; Manfred Thanner
Archive | 2008
Michael Rohleder; Gary Hay; Stephan Mueller; Manfred Thanner
Archive | 2006
Michael Rohleder; Davor Bogavac
Archive | 2013
Michael Rohleder; Gary Hay; Thomas Luedeke; Stephan Mueller
Archive | 2009
Michael Rohleder; Thomas Koch; Vladimir Litovtchenko; Thomas Luedeke
Archive | 2008
Michael Rohleder; Gary Hay; Stephan Mueller; Manfred Thanner
Archive | 2002
John William Doyle; John East Kilbride Logan; Michael Rohleder; Stephen Pickering
