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Michael Schnell

Carl Zeiss AG

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Publication

Featured researches published by Michael Schnell.

Ultramicroscopy | 2010

Energy resolution of an Omega-type monochromator and imaging properties of the MANDOLINE filter

Erik Essers; Gerd Benner; Thilo Mandler; Stefan Meyer; Dieter Mittmann; Michael Schnell; R. Höschen

Archive | 2012

Teilchenstrahlgerät und Verfahren zur Untersuchung und/oder Bearbeitung eines Objekts

Michael Schnell

Archive | 2011

PARTICLE BEAM DEVICE AND METHOD FOR ANALYZING AND/OR TREATING AN OBJECT

Michael Schnell

Microscopy and Microanalysis | 2018

DELTA - A Novel Ultra-Low Voltage SEM for Electron Spectroscopic Imaging

Rasmus R. Schröder; Bernd Schindler; Michael Schnell; Christian Hendrich; Jakob Wensorra; Wen-Shan Zhang; Jorg Eisele; Lisa Veith; Jochen Kammerer; Martin Pfannmöller; Dirk Preikszas; Irene Wacker

Archive | 2017

METHODS AND DEVICES FOR EXAMINING AN ELECTRICALLY CHARGED SPECIMEN SURFACE

Michael Budach; Michael Schnell; Bernd Schindler; Markus Boese

Archive | 2017

Verfahren und Vorrichtungen zum Untersuchen einer elektrisch geladenen Probenoberfläche

Michael Budach; Michael Schnell; Bernd Schindler; Markus Boese

Archive | 2016

HIGH-VOLTAGE SUPPLY UNIT AND CIRCUIT ARRANGEMENT FOR GENERATING A HIGH VOLTAGE FOR A PARTICLE BEAM APPARATUS

Edgar Fichter; Joerg Fober; Dirk Preikszas; Christian Hendrich; Michael Schnell; Momme Mommsen

Archive | 2016

Hochspannungsversorgungseinheit und Schaltungsanordnung zur Erzeugung einer Hochspannung für ein Teilchenstrahlgerät

Edgar Fichter; Jörg Fober; Dirk Preikszas; Christian Hendrich; Michael Schnell; Momme Mommsen

Archive | 2015

Teilchenstrahlgerät und Verfahren zum Betrieb eines Teilchenstrahlgeräts Particle beam device and method of operating a particle beam

Klaus Hegele; Edgar Fichter; Michel Aliman; Dirk Preikszas; Christian Hendrich; Momme Mommsen; Michael Schnell; Kai Schubert

Archive | 2015

Verfahren und Vorrichtungen zum Untersuchen einer elektrisch geladenen Probenoberfläche Methods and apparatus for inspecting an electrically charged sample surface

Michael Budach; Michael Schnell; Bernd Schindler; Markus Boese

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Christian Hendrich

Carl Zeiss AG

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Dirk Preikszas

Carl Zeiss AG

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Edgar Fichter

Carl Zeiss AG

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Momme Mommsen

Carl Zeiss AG

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Bernd Schindler

Carl Zeiss AG

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Kai Schubert

Carl Zeiss AG

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Markus Boese

Carl Zeiss AG

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Michael Budach

Carl Zeiss AG

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Joerg Fober

Carl Zeiss AG

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Klaus Hegele

Carl Zeiss AG

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