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Migita Shinji

National Institute of Advanced Industrial Science and Technology

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Featured researches published by Migita Shinji.

Archive | 2012

METHOD OF FORMING GATE STACK

Morita Yukinori; Migita Shinji; Ota Hiroyuki

IEICE Technical Report; IEICE Tech. Rep. | 2018

Concern of Ferroelectric HfO2 Films Brought by Large Coercive Field

Migita Shinji; Ota Hiroyuki; Toriumi Akira

IEICE Technical Report; IEICE Tech. Rep. | 2017

Demonstrating Performance Improvement of Complementary TFET Circuits by ION Enhancement Based on Isoelectronic Trap Technology

Mori Takahiro; Asai Hidehiro; Hattori Junichi; Fukuda Koichi; Otsuka Shintaro; Morita Yukinori; O'uchi Shin-ichi; Fuketa Hiroshi; Migita Shinji; Mizubayashi Wataru; Ota Hiroyuki; Matuskawa Takashi

IEICE Technical Report; IEICE Tech. Rep. | 2017

Fully Coupled 3-D Device Simulation of Negative Capacitance FinFETs for Sub 10 nm Integration

Ota Hiroyuki; Ikegami Tsutomu; Hattori Junichi; Fukuda Koichi; Migita Shinji; Toriumi Akira

The Japan Society of Applied Physics | 2016

Influence of Rapid Thermal Annealing on Structures of Ge Thin Films Grown at Low Temperature

Shintaro Otsuka; Mori Takahiro; Morita Yukinori; Uchida Noriyuki; Liu Yongxun; O'uchi Shin-ichi; Fuketa Hiroshi; Migita Shinji; Masahara Meisyoku; Matsukawa Takashi

IEICE Technical Report; IEICE Tech. Rep. | 2016

SRAM PUF using Polycrystalline Silicon Channel FinFET and Its Evaluation

O'uchi Shin-ichi; Liu Yungxun; Hori Yohei; Irisawa Toshifumi; Fuketa Hiroshi; Morita Yukinori; Migita Shinji; Mori Takahiro; Nakagawa Tadashi; Tsukada Junichi; Koike Hanpei; Masahara Meishoku; Matsukawa Takashi

IEICE Technical Report; IEICE Tech. Rep. | 2016

Design of SOI-FETs for Steep Slope Switching using Negative Capacitance in Ferroelectric Gate Insulators

Ota Hiroyuki; Migita Shinji; Hattori Junichi; Fukuda Koichi; Toriumi Akira

IEICE Technical Report; IEICE Tech. Rep. | 2016

Understanding of BTI for Tunnel FETs

Mizubayashi Wataru; Mori Takahiro; Fukuda Koichi; Ishikawa Yuki; Morita Yukinori; Migita Shinji; Ota Hiroyuki; Liu Yongxun; O'uchi Shin-ichi; Tsukada Junichi; Yamauchi Hiromi; Matsukawa Takashi; Masahara Meishoku; Endo Kazuhiko

IEEE Conference Proceedings | 2016