Mihiro Yanagihara

Soft x‐ray (97‐eV) phase retardation using transmission multilayers

Phase retardation as a function of incidence angle of 97‐eV soft x rays from a laser plasma source on transmission through a free‐standing molybdenum/silicon multilayer was measured using a multilayer polarizer and a polarization analyzer. The maximum retardation of 49° between σ and π components is over 2/3 that calculated for an ideal structure. At maximum retardation the transmittance ratio of σ‐ to π‐amplitudes was 0.66 and the intensity transmittance, averaged for both components, was 20%. These multilayer structures will be useful in soft x‐ray polarization applications.

Electronic structure of (formula presented)X-ray emission and absorption studies

Measurements of x-ray emission and absorption spectra of the constituents of

Investigation of carbon contamination of synchrotron radiation mirrors

{\mathrm{MgB}}_{2}

BURIED INTERFACES IN MO/SI MULTILAYERS STUDIED BY SOFT-X-RAY EMISSION SPECTROSCOPY

are presented. The results obtained are in good agreement with calculated x-ray spectra, with dipole matrix elements taken into account. The comparison of x-ray emission spectra of graphite,

Phase Diagram and Electrical Properties of Cu2-δTe

{\mathrm{AlB}}_{2},

Soft X-ray reflectometer with a laser-produced plasma source

and

Full polarization measurement of synchrotron radiation with use of soft x-ray multilayers

{\mathrm{MgB}}_{2}

Frustration of direct photoionization of Ar clusters in intense extreme ultraviolet pulses from a free electron laser

in the binding energy scale supports the idea of charge transfer from

Luminescence Excitation by VUV Photons in Alkali and Silver Halides

\ensuremath{\sigma}

A Soft-X-Ray Imaging Microscope with a Multilayer-Coated Schwarzschild Objective: Imaging Tests

to