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Featured researches published by Mike Pratt.


international conference on robotics and automation | 2000

Manufacturing feature recognition from solid models: a status report

JungHyun Han; Mike Pratt; William C. Regli

The field of solid modeling has developed a variety of techniques for unambiguous representations of three-dimensional objects. Feature recognition is a sub-discipline of solid modeling that focuses on the design and implementation of algorithms for detecting manufacturing information from solid models produced by computer-aided design (CAD) systems. Examples of this manufacturing information include features such as holes, slots, pockets and other shapes that can be created on modern computer numerically controlled machining systems. Automated feature recognition has been an active research area in solid modeling for many years and is considered to be a critical component for integration of CAD and computer-aided manufacturing. The paper gives an overview of the state-of-the-art in feature recognition research. Rather than giving an exhaustive survey, we focus on the three of the major algorithmic approaches for feature recognition: graph-based algorithms, volumetric decomposition techniques, and hint-based geometric reasoning. For each approach, we present a detailed description of the algorithms being employed along with some assessments of the technology. We conclude by outlining important open research and development issues.


Rapid Prototyping Journal | 2002

A proposed standards‐based approach for representing heterogeneous objects for layered manufacturing

Lalit Patil; Debasish Dutta; Amba D. Bhatt; Kevin K. Jurrens; Kevin W. Lyons; Mike Pratt; Ram D. Sriram

Information models for the representation of product data are being developed as an international standard. However, the current application protocols focus on the representation of homogeneous objects only. This paper suggests an information model to represent heterogeneous objects using the information modeling methodology developed for ISO 10303. The data planning model is then extended to represent the two‐dimensional (2D) slice information using concepts from ISO 10303. The proposed formats are validated by physical realization of objects on two LM machines. This information model will help in providing a uniform base in the development of heterogeneous solid modeling systems. It will also equip the solid modeler with the ability to integrate with other applications and process planning in the domain of layered manufacturing.


DE-Vol.109, Recent Advances in Design for Manufacture | 2000

Information Modeling of Conceptual Design Integrated with Process Planning

Ram D. Sriram; Mike Pratt; Shaw C. Feng; Yuyin Song


Archive | 1996

What are Feature Interactions

William C. Regli; Mike Pratt


Archive | 2000

Representation of Heterogeneous Objects in ISO 10303 (STEP)

Lalit Patil; Debasish Dutta; Amba D. Bhatt; Kevin K. Jurrens; Kevin W. Lyons; Mike Pratt; Ram D. Sriram


Archive | 1998

Towards STEP-Based Data Transfer in Layered Manufacturing

Debasish Dutta; Anil Kumar; Mike Pratt; Ram D. Sriram


NIST Interagency/Internal Report (NISTIR) - 5662 | 1995

Background Study: Requisite Elements, Rationale, and Technology Overview for the Systems Integration for Manufacturing Applications (SIMA) Program

Edward J. Barkmeyer; Ted Hopp; Mike Pratt; Gaylen Rinaudot


Journal of Computer-aided Molecular Design | 2007

Standardized Data Exchange of CAD Models with Design Intent | NIST

Junhwan Kim; Mike Pratt; Raj Iyer; Ram D. Sriram


Rapid Prototyping Journal | 2002

A Proposed ISO 10303 (STEP)-based Approach for Representing Heterogeneous Objects for Layered Manufacturing

Lalit Patil; Debasish Dutta; Amba D. Bhatt; Kevin K. Jurrens; Kevin W. Lyons; Mike Pratt; Ram D. Sriram


Computer Aided Design Journal - European | 2001

Progress Towards an International Standard for Data Transfer in Rapid

Lalit Patil; Debasish Dutta; Ram D. Sriram; Kevin W. Lyons; Amba D. Bhatt; Mike Pratt; M Allahabad

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Ram D. Sriram

National Institute of Standards and Technology

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Amba D. Bhatt

National Institute of Standards and Technology

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Kevin K. Jurrens

National Institute of Standards and Technology

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Kevin W. Lyons

National Institute of Standards and Technology

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Lalit Patil

University of Michigan

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Debasish Dutta

University of Illinois at Urbana–Champaign

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Edward J. Barkmeyer

National Institute of Standards and Technology

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Shaw C. Feng

National Institute of Standards and Technology

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Anil Kumar

National Institute of Standards and Technology

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