Mikhail I. Grinchuk
LSI Corporation
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Publication
Featured researches published by Mikhail I. Grinchuk.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems | 2007
Ahmad A. Al-Yamani; Narendra Devta-Prasanna; Erik Chmelar; Mikhail I. Grinchuk; Arun Gunda
This paper presents segmented addressable scan (SAS), a test architecture that addresses test data volume, test application time, test power consumption, and tester channel requirements using a hardware overhead of a few gates per scan chain. Using SAS, this paper also presents systematic scan reconfiguration, a test data compression algorithm that is applied to achieve 10times to 40 times compression ratios without requiring any information from the automatic-test-pattern-generation tool about the unspecified bits. The architecture and the algorithm were applied to both single stuck as well as transition fault test sets
Archive | 2010
Anatoli A. Bolotov; Mikhail I. Grinchuk; Timothy E. Hoglund; Lav D. Ivanovic; Paul G. Filseth
Archive | 2005
Ahmad A. Alyamani; Mikhail I. Grinchuk; Erik Chmelar
Archive | 2001
Partha P. Data Ray; Mikhail I. Grinchuk; Pedja Raspopovic
Archive | 2001
Partha P. Datta Ray; Mikhail I. Grinchuk; Pedja Raspopovic
Archive | 2012
Anatoli A. Bolotov; Shaohua Yang; Zongwang Li; Mikhail I. Grinchuk; Lav D. Ivanovic; Fan Zhang; Yang Han
Archive | 2014
Alexander S. Podkolzin; Lav D. Ivanovic; Anatoli A. Bolotov; Mikhail I. Grinchuk; Sergey Afonin
Archive | 2008
Mikhail I. Grinchuk; Anatoli A. Bolotov; Lav D. Ivanovic; Andrej A. Zolotykh; Alexei V. Galatenko
Archive | 2007
Anatoli A. Bolotov; Mikhail I. Grinchuk; Lav D. Ivanovic; Paul G. Filseth; Anton I. Sabev
Archive | 2003
Mikhail I. Grinchuk
