Mikio Naruse
JEOL Ltd.
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Featured researches published by Mikio Naruse.
Japanese Journal of Applied Physics | 2001
Tokushi Kizuka; Hajime Ohmi; Takao Sumi; Katsuyoshi Kumazawa; Shunji Deguchi; Mikio Naruse; Satoru Fujisawa; Shinya Sasaki; Akira Yabe; Yuji Enomoto
High-resolution transmission electron microscopy (HRTEM) has been developed to possess functions of atomic force microscopy and scanning tunneling microscopy. Dynamics of subnano Newton-scale force and conductance were simultaneously observed at intervals of 1/30–1/3840 s during HRTEM imaging of contact, deformation and fracture processes between nanometer-sized tips. The experimental basis of the atomic-scale mechanics of materials was developed on the basis of the present microscopy.
Japanese Journal of Applied Physics | 2001
Yoshio Bando; Masanori Mitome; Dmitri Golberg; Yoshizo Kitami; Keiji Kurashima; Toshihiko Kaneyama; Yoshihiro Okura; Mikio Naruse
In order to observe high-spatial-resolution elemental images using inelastic electrons, a 300 kV energy-filtering transmission electron microscope with an omega-type energy filter has been developed. Some characteristic features of the new microscope are described. The accelerating voltage dependence of the inelastic images is calculated to confirm that the spatial resolution for the elemental images is improved with an increase in the voltage from 120 kV to 300 kV. It is shown that a single atomic layer of oxygen atoms in Al11O3N9 crystal is well imaged as a bright line with a periodic separation of 2.9 nm al the c-axis. The spatial resolution for the oxygen images is about 0.5 nm, which corresponds well with the theoretical calculation.
Microscopy and Microanalysis | 2005
Masaki Mukai; W Inami; K Omoto; Toshikatsu Kaneyama; Takeshi Tomita; Katsushige Tsuno; Masami Terauchi; Kenji Tsuda; Yohei Sato; Mikio Naruse; Toshikazu Honda; Michiyoshi Tanaka
We have been developing a 200 kV analytical electron microscope, which is equipped with a monochromator [1]. The target performance of the microscope is to achieve an energy resolution of 0.2 eV with a smaller than 2 nm diameter probe on a specimen plane. Though the ultimate energy resolution of 0.14 eV was obtained with our first monochromator, the shape of the beam on the specimen plane was oval [2]. The new monochromator consists of two dodecapole-type Wien-filters (Fig. 1) of 30 mm length and a slit on the symmetric plane of the two filters [2], [3]. The upper (1st) filter and the electro-static round lens at the entrance of the monochromator make an energy-dispersed focus on the slit. The lower (2nd) filter cancels the energy dispersion and makes an achromatic and stigmatic focus at the exit of the monochromator. We obtained the energy dispersion of 19.5 μm/eV on the slit experimentally, which is sufficient to obtain the energy resolution of 0.2 eV using the slit. Figure 2 shows the shape of a 200 keV electron beam on the specimen plane with the new monochromator. It shows that an almost round shaped beam or a better achromatic beam of a 4 nm (FWHM) was obtained. A smaller beam than a 2 nm diameter on the specimen plane at the achromatic condition of the monochromator will be obtained by using a higher excitation condition of the probe forming lens system. We have succeeded in obtaining an energy-dispersed beam on the slit and a stigmatic and achromatic beam at the exit of the monochromator.
Microscopy and Microanalysis | 1998
Tokushi Kizuka; Nobuo Tanaka; Shunji Deguchi; Mikio Naruse
: Time-resolved high-resolution transmission electron microscopy at a spatial resolution of 0.2 nm and a time resolution of 1/60 sec using a piezo-driving specimen holder is reported here. Various types of atomic processes in mechanical interaction, such as contact, bonding, deformation, and fracture, in nanometer-sized gold crystallites and carbon nanotubes are demonstrated.
Archive | 1997
Tadanori Yoshioka; Mikio Naruse; Harumi Kihara
Journal of Electron Microscopy | 2005
Hidetaka Sawada; Takeshi Tomita; Mikio Naruse; Toshikazu Honda; Paul Hambridge; P Hartel; Maximilian Haider; C. J. D. Hetherington; R. C. Doole; Angus I. Kirkland; J.L. Hutchison; J.M. Titchmarsh; D. J. H. Cockayne
Archive | 1994
Yoshinori Fujiyoshi; Mikio Naruse
Journal of Electron Microscopy | 2003
Fumio Hosokawa; Takeshi Tomita; Mikio Naruse; Toshikazu Honda; Peter Hartel; Max Haider
Microscopy Research and Technique | 2004
Masanori Mitome; Yoshio Bando; Dmitri Golberg; Keiji Kurashima; Yoshihiro Okura; Toshikatsu Kaneyama; Mikio Naruse; Yoshiaki Honda
Microscopy and Microanalysis | 2006
Masaki Mukai; Wataru Inami; K Omoto; Toshikatsu Kaneyama; Takeshi Tomita; Katsushige Tsuno; Masami Terauchi; Kenji Tsuda; Mikio Naruse; Toshikazu Honda; Michiyoshi Tanaka