Mineo Moribe
Fujitsu
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Publication
Featured researches published by Mineo Moribe.
Japanese Journal of Applied Physics | 2004
Hiroyasu Kawano; Takahiro Umada; Mineo Moribe; Keiji Shono
The soft magnetic properties of electroless plated CoFeNi films were examined in terms of the underlayers. CoFeNi films on NiP underlayers had a high saturation flux density of 1.7 T and a small coercivity of less than approximately 300 A/m when the film thickness was more than 300 nm. With a thickness of less than 300 nm, however, the saturation flux density was significantly reduced, while the coercivity drastically increased. These properties could be improved by utilizing a NiFe underlayer, instead of a NiP underlayer, to improve the film structure around the interface between the CoFeNi film and the underlayer.
international symposium on consumer electronics | 2012
Norihiro Kakuko; Teruyuki Sato; Mineo Moribe; Takahiro Umada
This paper proposes a novel stereoscopic 3D photographic technology with a stereo adapter attached to a monocular camera. From a cameras image, we select left and right ones with an adaptive threshold based on an amount of light entering the camera. Furthermore, we correct distortion of the left and right images by utilizing a new criterion derived from correctness of searching directions. Consequently, an automatic stereoscopic 3D photographing can be achieved.
Optical Storage Technology and Applications | 1988
Mineo Moribe; Yasunobu Hashimoto; Miyozo Maeda; Ken-ichi Itoh; Seiya Ogawa
The number of bit errors in magneto-optical disks were reduced and a bit-error rate of 10-6 was achieved even after an accelerated lifetime test. To reduce the number of bit errors, we performed error detection and classification and found that the substrate was the dominant cause of errors. The substrate we used was a photopolymer(2P)-glass substrate, and we found two types of defect origin. One of them was due to 2P residues on the stamper, and the other was due to dust adhering to the substrate. We reduced the initial bit-error rate by removing these defects. We also found that 2P impurities considerably increase the bit-error rate during the accelerated lifetime test. By purifying the 2P, we made our disks more stable, and estimated that their lifetime would exceed 20 years at 40°C and 90% RH.
Archive | 1996
Mineo Moribe; Haruhiko Izumi; Masakazu Taguchi; Iwao Tsugawa
Archive | 1996
Mineo Moribe; Makoto Yoshioka
Archive | 1997
Mineo Moribe; Kenichi Utsumi; Zenichi Nagashima; Hiroyuki Kobayashi; Keiichi Murakami
Archive | 2005
Ken-ichi Itoh; Hiroshi Nakao; Hideyuki Kikuchi; Mineo Moribe; Hideki Masuda
Archive | 1993
Miyozo Maeda; Mineo Moribe; Susumu Satoh; Kyoko Miyabe
Archive | 1997
Sumio Kuroda; Mineo Moribe; Koichi Iida
Archive | 1996
Yasumasa Iwamura; Mineo Moribe; Ken-ichi Itoh