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Dive into the research topics where Mingxiu Li is active.

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Featured researches published by Mingxiu Li.


Microelectronics Reliability | 2016

Improvement of reliability for high-ohmic Cr–Si thin film resistors in a heat and humid environment: Removing moisture source by electrocatalytic decomposition of water

Xu Wang; Qiang Cheng; Xiaopin Ma; Hao Zhang; Mingxiu Li; Tongning Chen; Ping Zhang; J.Q. Shao

Abstract The reliability of high-ohmic Cr–Si thin film resistors in a heat and humid (HH) environment is often guaranteed by packaging materials as protection layers. Our previous study shows that Cr–Si–Ni film has a better performance in HH resistance than Cr–Si film in the same experimental conditions, and the proposed hypothesis that the electrocatalytic activity of Ni in the resistive film leads to water decomposition is considered as the reason behind it. In addition, NiMo alloy film is reported to have a better electrocatalytic activity on water decomposition than Ni film. So an issue arises: will the Cr–Si film co-doped by both Ni and Mo have a better performance in HH resistance than Cr–Si film only doped by Ni? In our current full paper, Cr–Si–Ni–Mo and Cr–Si–Ni films with low temperature coefficient of resistance (TCR) were prepared and compared in the same conditions to study their performance in a HH environment, which may address the raised issue from experimental data and further verify the proposed hypothesis. Possible reasons for the experimental results were discussed. If the proposed hypothesis is true, another way may be opened up to improve the reliability of high-ohmic Cr–Si resistors in a HH environment.


Microelectronics Reliability | 2016

Degradation behavior and mechanism of polymer films for high-ohmic resistor protection in a heat and humid environment

Xu Wang; Huabin Zhang; Xiaopin Ma; Qiang Cheng; C.G. Li; Mingxiu Li; Tongning Chen; Ping Zhang; J.Q. Shao

Abstract The protection of polymer films is critical to the reliability of high-ohmic resistors working in a heat and humid environment, and temperature is the main factor resulting in failure of coated resistors. However, in this study hydrogen evolution reaction (HER) and corrosion reaction of OH − ions are found to be another two important factors determining the fate of coated resistors. When temperature effects can be neglected, corrosion resulted from OH − ions generated in HER may be the major reason of polymer degradation, the mechanism of which is discussed based on the polymer films mainly formed by phenolic and epoxy resins.


Journal of Materials Science: Materials in Electronics | 2016

Preparation of Li2MoO4 using aqueous solution method and microwave dielectric properties after sintering

Hao Zhang; Xiuyu Wang; Qiang Cheng; Xiaopin Ma; Mingxiu Li; Ping Zhang; Yonggui Zhao


Sensors and Actuators B-chemical | 2018

Synthesis of 3D flower-like ZnSnO 3 and improvement of ethanol-sensing properties at room temperature based on nano-TiO 2 decoration and UV radiation

Xiuyu Wang; Bonan Ding; Yanpeng Liu; Xuantong Zhu; Heng Li; Mengzhen Xia; Hui Fu; Mingxiu Li


Journal of Materials Science: Materials in Electronics | 2017

UV-enhanced ethanol-sensing properties of TiO2-decorated ZnSnO3 hollow microcubes at low temperature

Xiuyu Wang; Mingxiu Li; Bonan Ding; Yanpeng Liu; Tongning Chen


Journal of Materials Science: Materials in Electronics | 2017

Preparation and characteristics of polyimide/CaMoO4 nanocomposites with enhanced dielectric performance and thermal stability

Xiuyu Wang; Tongning Chen; Mingxiu Li; Bonan Ding; Yanpeng Liu; Hao Zhang; Jianwen Liao


Chemical Physics Letters | 2016

A highly conductive poly(3,4-ethylenedioxythiophene):poly(styrene sulfonate) film with the solvent bath treatment by dimethyl sulfoxide as cathode for polymer tantalum capacitor

Xiaopin Ma; Xiuyu Wang; Mingxiu Li; Tongning Chen; Hao Zhang; Qiang Chen; Bonan Ding; Yanpeng Liu


Chemistry Letters | 2016

Improved Performances of Solid Tantalum Electrolytic Capacitors Using EG-treated PEDOT:PSS Conducting Polymer as Cathode Electrodes

Xiaopin Ma; Xiuyu Wang; Mingxiu Li; Tongning Chen; Hao Zhang; Qiang Cheng


Superlattices and Microstructures | 2017

Mechanism on M (MNi, Mo, NiMo) as deep level impurity reducing the TCR of Si-rich CrSi resistive films

Xu Wang; Yanpeng Liu; Bonan Ding; Mingxiu Li; Tongning Chen; Xuantong Zhu


Transactions of Tianjin University | 2016

Failure behaviors and mechanisms of high-ohmic resistors protected by PF/EP paint in heat and humid environment

Xiuyu Wang; Qiang Cheng; Xiaopin Ma; Hao Zhang; Mingxiu Li; Tongning Chen; Ping Zhang; Zhixun Li

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