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Featured researches published by Mitsuhiro Oki.


Analytical Methods | 2010

Rapid analysis of polybrominated diphenyl ethers by ion attachment mass spectrometry

Yuka Sato; Mitsuhiro Oki; Asato Kondo; Miyuki Takenaka; Hideki Satake

Novel rapid analytical method was developed for evaluating polymers for the presence of polybrominated diphenyl ethers (PBDEs), which have been prohibited by the RoHS directive, using ion attachment mass spectrometry (IAMS). IAMS requires no chemical pretreatment or separation process for the individual organic compounds before analysis because of its “soft” ionization feature. When measurement was performed for a standard solution of decabromodiphenly ether (decaBDE), no fragment ions were detected. The optimum analysis conditions for polymers were determined using reference materials. When polymers containing decaBDE were analyzed by IAMS under the optimum conditions, a decaBDE concentration of approximately 300 ppm (in the case of 1-mg solid sample for analysis) could be detected with no fragmentation. Even if other brominated compounds, such as ethylene (bis-tetrabromophthal)imide (EBTBPI) and bis(pentabromophenyl)ethane (BPBPE) were present in the sample together with decaBDE, each compound could be identified successfully. In addition, with respect to the validation of IAMS, it was confirmed the limit of detection (LOD) and the limit of quantification (LOQ) for decaBDE were 13.5 and 45.0 ppm (in the case of 1-mg solid sample for analysis), respectively, and that the calibration curve showed good linearity (R2 = 0.9962) within the range of 0.04 to 2.00 μg. The recovery of the decaBDE from the certified reference materials was 81.4% for the 317-ppm sample and 85.4% for 886-ppm sample.


Applied Spectroscopy | 2014

Application of X-ray Absorption Fine Structure Method for the Quantitative Analysis of Hexavalent Chromium in Chromate Conversion Coating and Plastic

Mitsuhiro Oki; Sayaka Morimoto; Miho Muramatsu; Masahiko Yoshiki; Miyuki Takenaka

The X-ray absorption fine structure method was applied for the quantitative analysis of hexavalent Cr in electronic products. The pre-edge peak intensity of the Cr K-edge increased according to the hexavalent Cr amount, and the hexavalent Cr ratio was calculated quantitatively by using the intensity. By combining with inductively coupled plasma atomic emission spectroscopy measurement results that gave the total Cr amount, the absolute amount of hexavalent Cr in chromate conversion coating and plastic samples could be evaluated. The results obtained by this method were in good agreement with those obtained by the chemical analysis method. This method can be successfully applied for the determination of hexavalent Cr amount in electronic products such as chromate conversion coating and plastic.


Archive | 2008

DETECTOR AND PRODUCTION METHOD THEREOF

Tomoyuki Kitani; Miyuki Takenaka; Mitsuhiro Oki; Masami Okamura


Archive | 2013

Joint with first and second members with a joining layer located therebetween containing Sn metal and another metallic material; methods for forming the same joint

Toshihide Takahashi; Tatsuoki Kono; Mitsuhiro Oki; Akiko Suzuki


Archive | 2005

Quantitative analysis method for hexavalent chromium in chromate coating film

Mitsuhiro Oki; Miyuki Takenaka; Tetsuya Tatebe; 充浩 沖; 哲也 立部; みゆき 竹中


Archive | 2012

METHOD OF QUANTITATIVE ANALYSIS OF HEXAVALENT CHROMIUM IN CHROMATE COATING AND METHOD FOR CONTROLLING HAZARDOUS ELEMENT IN ENCAPSULATING RESIN OF RESIN ENCAPSULATION SEMICONDUCTOR DEVICE

Mitsuhiro Oki; Miyuki Takenaka


Archive | 2009

Method for extracting hexavalent chromium

Miho Muramatsu; Mitsuhiro Oki; Miyuki Takenaka


Archive | 2010

METHOD FOR ANALYZING ANTIMONY CONTAINED IN GLASS

Sayaka Morimoto; Miyuki Takenaka; Mitsuhiro Oki


Archive | 2006

Method of quantitative analysis of hexavalent chromium in chromate coating

Tetsuya Tachibe; Mitsuhiro Oki; Miyuki Takenaka


Analytical Sciences | 2005

Test Method for the Presence or Absence of Pb in Electrical Components Using Energy-Dispersive Micro X-ray Fluorescence

Wakako Araki; Kaoru Mizoroki; Mitsuhiro Oki; Miyuki Takenaka

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