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Dive into the research topics where Moshe Leibowitz is active.

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Featured researches published by Moshe Leibowitz.


bipolar/bicmos circuits and technology meeting | 1999

2.5 GHz pin electronics SiGe driver for IC test equipment

David Goren; Michael Zelikson; Moshe Leibowitz; Frank Szenher

The design and characterization of a 2.5 GHz pin electronic SiGe driver is reported. Measured performance includes: programmable output swing from 100 mV to 1.7 V into 25 /spl Omega/ t/sub rise//t/sub fall/ of 60 ps at full swing, propagation delay dispersion of 20 ps.


Archive | 1990

Dynamic process for the generation of biased pseudo-random test patterns for the functional verification of hardware designs

Aharon Aharon; Ayal Bar-David; Raanan Gewirtzman; Emanuel Gofman; Moshe Leibowitz; Victor Shwartzburd


Archive | 2007

System, method and device of generating a random value

Assaf Barak; Eli Bloch; Elazar Kachir; Anastasia Ester Kapchits; Oded Katz; Moshe Leibowitz; Dan Ramon; Israel A. Wagner


Archive | 1999

Multiplexer for asynchronous data

Moshe Leibowitz; Israel A. Wagner; Uri Elazar


Archive | 2005

Method and system for enhancing circuit design process

Niv Amit; Ronit Bustin; Lidor Goren; Omer Heymann; Moshe Leibowitz; Gil Noy; Alex Raphayevich; Maya Speiser


Archive | 2005

Method and system for modeling wiring routing in a circuit design

Niv Amit; Ronit Bustin; Lidor Goren; Omer Heymann; Moshe Leibowitz; Gil Noy; Alex Raphayevich; Maya Speiser


Archive | 2000

One layer spider interconnect

Michael Zelikson; Moshe Leibowitz; Israel A. Wagner


Archive | 2002

Flash analog-to-digital converter using folded differential logic encoder having capacitors which distribute charge

Tibi Galambos; Moshe Leibowitz; Eliyahu Shamsaev


Archive | 2005

Method and system for embedding wire model objects in a circuit schematic design

Niv Amit; Ronit Bustin; Lidor Goren; Omer Heymann; Moshe Leibowitz; Gil Noy; Alex Raphayevich; Maya Speiser


Archive | 1991

Dynamisches Verfahren zur Generierung von Pseudozufallstestmustern zur Funktionsprüfung von Hardwaredesigns Dynamic method for generating pseudo-random test patterns for testing the function of hardware designs

Aharon Aharon; Ayal Bar-David; Emanuel Gofman; Moshe Leibowitz; Victor Shwartzburd; Raanan Gewirtzman

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