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Murakami Hideki

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Featured researches published by Murakami Hideki.

Archive | 2010

METHOD OF MANUFACTURING GERMANIUM OXIDE, AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE USING THE SAME

Murakami Hideki; Miyazaki Seiichi; Azuma Seiichiro

IEICE Technical Report; IEICE Tech. Rep. | 2007

Depth Profiling of Chemical Composition and Defect State Density of SiNx Formed by Plasma CVD

Miura Masahi; Ohta Akio; Murakami Hideki; Higashi Seiichiro; Miyazaki Seiichi; Kohno Masayuki; Nishida Tatsuo; Nakanishi Toshio

IEICE Technical Report; IEICE Tech. Rep. | 2014

Efficient Activation of As+ Ion implantation into Ge substrate for Formation of Low-Resistive Shallow Junction

Hamada Shinya; Murakami Hideki; Ono Takahiro; Hashimoto Kuniaki; Ohta Akio; Hanafusa Hiroaki; Higashi Seiichiro; Miyazaki Seiichi

IEICE Technical Report; IEICE Tech. Rep. | 2013

Resistive Switching Properties of SiOx/TiO2 Multi-Stack in Ti-electrode MIM Diodes

Ohta Akio; Fukusima Motoki; Makihara Katsunori; Murakami Hideki; Higashi Seiichiro; Miyazaki Seiichi

IEICE Technical Report; IEICE Tech. Rep. | 2012

Control of Schottky Barrier Height at Al/Ge Junctions by Ultrathin Layer Insertion

Ohta Akio; Matsui Masafumi; Murakami Hideki; Higashi Seiichiro; Miyazaki Seiichi

IEICE Technical Report; IEICE Tech. Rep. | 2011

Photoemission Study of Chemical Bonding Features at Metal/GeO2 Interfaces

Matsui Masafumi; Fujioka Tomohiro; Ohta Akio; Murakami Hideki; Higashi Seiichiro; Miyazaki Seiichi

IEICE Technical Report; IEICE Tech. Rep. | 2010

Characterization of Mg Diffusion into HfO2/SiO2/Si(100) Stacked Structures and Its Impact on Detect State Densities

Ohta Akio; Kanme Daisuke; Murakami Hideki; Higashi Seiichiro; Miyazaki Seiichi

IEICE Technical Report; IEICE Tech. Rep. | 2010

The Impact of H2 Anneal on Resistive Switching in Pt/TiO2/Pt Structure

Wei Guobin; Goto Yuta; Ohta Akio; Makihara Katsunori; Murakami Hideki; Higashi Seiichiro; Miyazaki Seiichi

IEICE Technical Report; IEICE Tech. Rep. | 2010

Characterization of Chemical Bonding Features and Electrical Properties of Ge MIS and Ge/Metal Structures

Fujioka Tomohiro; Bando Tatsuya; Ohta Akio; Murakami Hideki; Higashi Seiichiro; Miyazaki Seiichi

Technical report of IEICE. SDM | 2009

Characterization of Chemical Bonding Features and Electronic States at TiO_2/Pt Interface

Goto Yuta; Kanme Daisuke; Ohta Akio; Wei Guobin; Murakami Hideki; Higashi Seiichiro; Miyazaki Seiichi

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