N.R. Lugg

Probe integrated scattering cross sections in the analysis of atomic resolution HAADF STEM images

The physical basis for using a probe-position integrated cross section (PICS) for a single column of atoms as an effective way to compare simulation and experiment in high-angle annular dark-field (HAADF) scanning transmission electron microscopy (STEM) is described, and the use of PICS in order to make quantitative use of image intensities is evaluated. It is based upon the calibration of the detector and the measurement of scattered intensities. Due to the predominantly incoherent nature of HAADF STEM, it is found to be robust to parameters that affect probe size and shape such as defocus and source coherence. The main imaging parameter dependencies are on detector angle and accelerating voltage, which are well known. The robustness to variation in other parameters allows for a quantitative comparison of experimental data and simulation without the need to fit parameters. By demonstrating the application of the PICS to the chemical identification of single atoms in a heterogeneous catalyst and in thin, layered-materials, we explore some of the experimental considerations when using this approach.

On the quantitativeness of EDS STEM.

Chemical mapping using energy dispersive X-ray spectroscopy (EDS) in scanning transmission electron microscopy (STEM) has recently shown to be a powerful technique in analyzing the elemental identity and location of atomic columns in materials at atomic resolution. However, most applications of EDS STEM have been used only to qualitatively map whether elements are present at specific sites. Obtaining calibrated EDS STEM maps so that they are on an absolute scale is a difficult task and even if one achieves this, extracting quantitative information about the specimen - such as the number or density of atoms under the probe - adds yet another layer of complexity to the analysis due to the multiple elastic and inelastic scattering of the electron probe. Quantitative information may be obtained by comparing calibrated EDS STEM with theoretical simulations, but in this case a model of the structure must be assumed a priori. Here we first theoretically explore how exactly elastic and thermal scattering of the probe confounds the quantitative information one is able to extract about the specimen from an EDS STEM map. We then show using simulation how tilting the specimen (or incident probe) can reduce the effects of scattering and how it can provide quantitative information about the specimen. We then discuss drawbacks of this method - such as the loss of atomic resolution along the tilt direction - but follow this with a possible remedy: precession averaged EDS STEM mapping.

Prospects for lithium imaging using annular bright field scanning transmission electron microscopy: A theoretical study

There is strong interest in lithium imaging, particularly because of its significance in battery materials. However, light atoms only scatter electrons weakly and atomic resolution direct imaging of lithium has proven difficult. This paper explores theoretically the conditions under which lithium columns can be expected to be directly visible using annular bright field scanning transmission electron microscopy. A detailed discussion is given of the controllable parameters and the conditions most favourable for lithium imaging.

Chemical Imaging at Atomic Resolution as a Technique To Refine the Local Structure of Nanocrystals

The challenging problem of mapping the chemical composition of cation columns in individual nanocrystals at atomic resolution is addressed by using a method based on aberration-corrected electron microscopy, core-loss electron energyloss spectroscopy, and simulations. The potential of this novel approach to provide unique structural information, which is the key to rationalizing macroscopic behavior, is illustrated with the analysis of ceria–zirconia mixed oxides, which are nanomaterials with substantial technological impact. Metal nanoparticles supported on this family of oxides are currently materials of interest as catalysts in a variety of chemical transformations in the area of environmental protection, such as low-temperature water-gas shift, selective oxidation of CO in the presence of large amounts of hydrogen, or three-way catalysis. Strong variations in the chemistry of ceria–zirconia mixed oxide catalysts have been observed after they have undergone redox cycles involving reduction treatments at high temperatures ( 1173 K) then oxidation at mild temperatures ( 823 K). In particular their reducibility is significantly enhanced after such aging treatments. Scanning transmission electron microscopy (STEM) techniques have provided crucial information to account for these changes in the redox behavior. High-resolution electron microscopy (HREM) combined with high-angle annular dark-field (HAADF) imaging and tomography have revealed the occurrence of a disorder–order transformation in the cationic sublattice of these oxides, which tend to rearrange into a distribution characteristic of the so called pyrochlore phase. This phase is an archetype structure for A2B2O7 (A= + 3 cation, B=+ 4 cation) compounds and can be considered a fluorite superstructure. The structural transformation takes place during the reduction step of the cycle, in which the fully reduced mixed oxide with Ce/Zr molar ratio 1:1 adopts the Ce2Zr2O7 stoichiometry. Nevertheless, HAADF studies have clearly shown that, in the case of ceria–zirconia mixed oxides, this cation-ordered arrangement is preserved even after full reoxidation, that is, in the oxide with Ce2Zr2O8 stoichiometry, whenever the oxidation temperature does not exceed 823 K. Electron-microscopy studies have also revealed another remarkable feature of the ceria–zirconia aged oxides with the pyrochlore-type cation sublattice: the occurrence of compositional heterogeneities at the nanometer scale. Taking these observations into account and also considering that the disorder–order transition may not be completed in the time scale and under the temperature conditions used in the redox-cycling treatments, the important question arises whether these heterogeneities are in fact occurring on a finer scale, that is, at the atomic level. Such heterogeneities, compatible with the HREM and HAADF observations, will strongly influence the details of the counterpart oxygen sublattice and, consequently, the chemical and catalytic response of these oxides. To date, the atomic-column by atomic-column compositional analysis of the oxidized pyrochlore required to justify such a possibility has not been accomplished. Herein, using the capabilities of an aberration-corrected Nion UltraSTEM microscope (operated at 100 kV) we not only provide the first direct chemical evidence of the cationic order present in the Ce2Zr2O8 oxidized pyrochlore but we also show how atomicresolution electron energy-loss spectroscopy (EELS) mapping, based on core–shell ionization, can be combined with EELS image simulation to detect quite subtle local deviations in the cation sublattice from the completely ordered structure. This information provides a much more accurate structural description of the active catalyst nanocrystals, which must be considered to model both their oxygen-exchange capabilities and, eventually, their catalytic performance. [*] Dr. S. Trasobares, Dr. M. L pez-Haro, Dr. J. A. Perez-Omil, Dr. J. J. Calvino Departamento de Ciencia de los Materiales e Ingenier a Metalfflrgica y Qu mica Inorg nica Facultad de Ciencias, Universidad de C diz Campus Rio San Pedro, 11510-Puerto Real, C diz (Spain) Fax: (+34)956-016286 E-mail: susana.trasobares@uca.es Homepage: http://www.uca.es/tem-uca

Removing the effects of elastic and thermal scattering from electron energy-loss spectroscopic data

Electron energy-lossspectroscopy(EELS) studies in scanning transmission electron microscopy are widely used to investigate the location and bonding of atoms in condensed matter. However, the interpretation of EELS data is complicated by multiple elastic and thermal diffuse scattering of the probing electrons. Here, we present a method for removing these effects from recorded EELS spectrum images, producing visually interpretable elemental maps and enabling direct comparison of the spectral data with established first-principles energy-loss fine structure calculations.

Elemental mapping in scanning transmission electron microscopy

We discuss atomic resolution chemical mapping in scanning transmission electron microscopy (STEM) based on core-loss electron energy loss spectroscopy (EELS) and also on energy dispersive X-ray (EDX) imaging. Chemical mapping using EELS can yield counterintuitive results which, however, can be understood using first principles calculations. Experimental chemical maps based on EDX bear out the thesis that such maps are always likely to be directly interpretable. This can be explained in terms of the local nature of the effective optical potential for ionization under those imaging conditions. This is followed by an excursion into the complementary technique of elemental mapping using energy-filtered transmission electron microscopy (EFTEM) in a conventional transmission electron microscope. We will then consider the widely used technique of Z-contrast or high-angle annular dark field (HAADF) imaging, which is based on phonon excitation, where it has recently been shown that intensity variations can be placed on an absolute scale by normalizing the measured intensities to the incident beam. Results, showing excellent agreement between theory and experiment to within a few percent, are shown for Z-contrast imaging from a sample of PbWO4 .

A new method to detect and correct sample tilt in scanning transmission electron microscopy bright-field imaging

Important properties of functional materials, such as ferroelectric shifts and octahedral distortions, are associated with displacements of the positions of lighter atoms in the unit cell. Annular bright-field scanning transmission electron microscopy is a good experimental method for investigating such phenomena due to its ability to image light and heavy atoms simultaneously. To map atomic positions at the required accuracy precise angular alignment of the sample with the microscope optical axis is necessary, since misalignment (tilt) of the specimen contributes to errors in position measurements of lighter elements in annular bright-field imaging. In this paper it is shown that it is possible to detect tilt with the aid of images recorded using a central bright-field detector placed within the inner radius of the annular bright-field detector. For a probe focus near the middle of the specimen the central bright-field image becomes especially sensitive to tilt and we demonstrate experimentally that misalignment can be detected with a precision of less than a milliradian, as we also confirm in simulation. Coma in the probe, an aberration that can be misidentified as tilt of the specimen, is also investigated and it is shown how the effects of coma and tilt can be differentiated. The effects of tilt may be offset to a large extent by shifting the diffraction plane detector an amount equivalent to the specimen tilt and we provide an experimental proof of principle of this using a segmented detector system.

Atomic resolution chemical bond analysis of oxygen in La2CuO4

The distorted CuO6 octahedron in La2CuO4 was studied using aberration-corrected scanning transmission electron microscopy at atomic resolution. The near-edge structure in the oxygen K-edge electron energy-loss spectrum was recorded as a function of the position of the electron probe. After background subtraction, the measured spectrum image was processed using a recently developed inversion process to remove the mixing of signals on the atomic columns due to elastic and thermal scattering. The spectra were then compared with first-principles band structure calculations based on the local-density approximation plus on-site Coulomb repulsion (LDA + U) approach. In this article, we describe in detail not only anisotropic chemical bonding of the oxygen 2p state with the Cu 3d state but also with the Cu 4p and La 5d/4f states. Furthermore, it was found that buckling of the CuO2 plane was also detectable at the atomic resolution oxygen K-edge. Lastly, it was found that the effects of core-hole in the O K-edge were strongly dependent on the nature of the local chemical bonding, in particular, whether it is ionic or covalent.

Scanning transmission electron microscopy imaging dynamics at low accelerating voltages

Motivated by the desire to minimize specimen damage in beam sensitive specimens, there has been a recent push toward using relatively low accelerating voltages (<100 kV) in scanning transmission electron microscopy. To complement experimental efforts on this front, this paper seeks to explore the variations with accelerating voltage of the imaging dynamics, both of the channelling of the fast electron and of the inelastic interactions. High-angle annular-dark field, electron energy loss spectroscopic imaging and annular bright field imaging are all considered.

Misalignment Induced Artifacts in Quantitative Annular Bright-Field Imaging

Local structural distortion at defects such as grain boundaries, hetero-interfaces, dislocations and surfaces can significantly influence on a broad variety of physical properties in complex oxide materials. Precise measurement of localized structure distortion at these defects can provide new insights into mechanistic understanding as to how materials properties quantitatively depend on the microstructures and subsequently how we can engineer defects to optimize the materials/devices. The recent advances in aberration corrected (scanning) transmission electron microscopy (Cs-S/TEM) have made it possible to measure the distance between atom positions with picometer-precision [1-3]. In particular, the annular bright field (ABF) imaging [4] allows us to simultaneous visualize both heavy and light element columns over a wide range of thickness, enabling determination of positions of full atomic species from a single image for quantitative measurements.