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Featured researches published by Naohiro Sugiyama.


Journal of Crystal Growth | 1998

Step structures and dislocations of SiC single crystals grown by modified Lely method

Naohiro Sugiyama; Atsuto Okamoto; Kohei Okumura; Toshihiko Tani; Nobuo Kamiya

Step structures on the {0 0 0 1} facet of SiC single crystals grown by the modified Lely method were examined through an optical microscopy and an atomic force microscopy to discuss the dependence on the polytype and the polarity. The results were compared with those of CVD method. Step structures around micropipes were quite different for the different polarity of a growing surface. No micropipes were detected at the center of spirals with a step height of 1.5 nm for 6H-SiC. Quantitative morphological features could be corresponded to the variety of etch pits by chemical etching on the growing surface. The dislocations and their motions during the growth were also characterized through etching and polishing the grown crystal from the surface to the inside successively. The screw dislocations shifted outwards from the center of a giant spiral as the growth proceeded. In contrast, the edge dislocations glided in any directions. Discussion was carried out on these results.


Materials Science and Engineering B-advanced Functional Solid-state Materials | 1999

The photoelastic constant and internal stress around micropipe defects of 6H-SiC single crystal

Tomohisa Kato; Hitoshi Ohsato; Atsuto Okamoto; Naohiro Sugiyama; Takashi Okuda

Abstract Hexagonal silicon carbide (6H-SiC) single crystals made by a modified Lely method contain a ‘micropipe’ which is one kind of serious defects degrading device performance. The micropipe accompanies strong internal stress around itself. We determined the photoelastic constant in the plane of (00·1) 6H-SiC and then estimated the magnitude of the internal stress around the micropipes. The photoelastic constant was 2.73 brewster at λ =546 nm. The internal stress around the micropipe was estimated to be 113∼166 MPa.


Advanced Materials '93#R##N#Ceramics, Powders, Corrosion and Advanced Processing | 1994

Phase relations between Y- α′ - and β′ -Sialons in Si3N4—AlN—Y2O3 system

Naohiro Sugiyama; Yoshio Ukyo; Shigetaka Wada

This paper discusses the phase relations between Y-α′-and β′-Sialon in Si3N4−AlN-Y2O3 system. The total amount of AlN and Y2O3 varied from 5 to 11 wt%, and the molar ratio of AlN/Y2O3 was 0 to 11. Specimens were prepared by hot-pressing, and were then heat treated for 50 hr. Compounds including SiO2 were formed in the region of small amounts of AlN. The phases formed by hot pressing changed during the heat treatment. The fraction of α′-Sialon was decreased by the heat treatment. The solubility of α′-Sialon, changing with the composition before the heat treatment, converged to a constant after the heat treatment. On the other hand, that of β′-Sialon showed little change due to the heat treatment.


Archive | 1997

Method of producing silicon carbide single crystal

Naohiro Sugiyama; Atsuto Okamoto; Toshihiko Tani; Nobuo Kamiya


Materials Science Forum | 1998

Step Structures and Structural Defects in Bulk SiC Crystals Grown by Sublimation Method

Atsuto Okamoto; Naohiro Sugiyama; Toshihiko Tani; Nobuo Kamiya


Materials Science Forum | 2002

Self-Healing Phenomenon of Micropipes in Silicon Carbide

Atsuto Okamoto; Yoshiki Seno; Naohiro Sugiyama; Fusao Hirose; Kazukuni Hara; Toshihiko Tani; Daisuke Nakamura; Nobuo Kamiya; Shoichi Onda


Journal of The Ceramic Society of Japan | 1993

Phase Relations between α′- and β′-Sialons in Si3N4(-SiO2)-AlN-Y2O3 System

Naohiro Sugiyama; Yoshio Ukyo; Shigetaka Wada


Journal of The Ceramic Society of Japan | 1994

Thermal Stability of Phases in Si3N4(-SiO2)-AlN-Y2O3 System

Naohiro Sugiyama; Yoshio Ukyo; Shigetaka Wada


Journal of The Ceramic Society of Japan | 1994

Thermal Stability of Y-α′-Sialon Prepared from Si3N4-Y2O3-AlN

Yoshio Ukyo; Naohiro Sugiyama; Shigetaka Wada


Materials Science Forum | 2000

Investigation of the Origin of Micropipe Defect

Atsuto Okamoto; Naohiro Sugiyama; Toshihiko Tani; Nobuo Kamiya

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