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Publication
Featured researches published by Naoki Fukunaga.
IEEE Transactions on Consumer Electronics | 1998
Takahiro Takimoto; Naoki Fukunaga; Masaru Kubo; Naonori Okabayashi
An optical pickup OPIC/sup TM/ with a built-in high-speed split photodiode and new device structure, has been developed. We have successfully fabricated the OPIC with a cutoff frequency of 56 MHz for 780 nm wavelength radiation. We developed hologram laser in which a semiconductor laser, the OPIC and hologram glass are set as a unit, too. The development of these OPIC were made possible by the high-speed split photodiode, which have very high resistive Si substrate for reduction of the junction capacitance. The cutoff frequency of the high speed split photodiode thus realized is 61 MHz for 780 nm wavelength radiation. This photodiode has a double-layer anti-reflection film consisting of a silicon oxide film as the first layer and a silicon nitride film as the second layer. We show the structure of this new device, its fabrication process and the performance of the photodiode and OPIC.
IEEE Transactions on Consumer Electronics | 1997
Naoki Fukunaga; Motohiko Yamamoto; Masaru Kubo; Naonori Okabayashi
An optical pickup OPIC/sup TM/ with a built-in high-speed split photodiode and new device structure, has been developed. We have successfully fabricated the OPIC with a cutoff frequency of 18.4 MHz for 780 nm radiation and 21.1 MHz for 635 nm radiation. The development of the OPIC was made possible by the high-speed photodiode, which has n-type buried diffusion regions formed in the vicinity of the p-type buried isolation diffusion regions. An anti-reflection film is formed directly on the isolation region of the split photodiode as well as on the photodiode, therefore enhancing the sensitivity. The cutoff frequency of the photodiode thus realized is 24 MHz for 780 nm radiation and 41 MHz for 635 nm radiation and the reflection rate is lower than 3%. The OPIC is compatible with 12/spl times/ speed CD-ROM and DVD optical systems. We show the structure of this new device and its fabrication process. We found that the cutoff frequency of the photodiode is lower when the isolation region is irradiated than when the center region of the photodiode is irradiated. We studied the mechanism of the above difference of the cutoff frequency of the photodiode using device simulations.
Archive | 2001
Naoki Fukunaga; Kazuhiro Natsuaki
Archive | 2010
Naoki Fukunaga; Masakazu Ikeda; Katsumi Inaba; Mitsuru Mariyama; Yasuhiro Maruyama; Hiroyuki Shoji; Hirohisa Warita; 康弘 丸山; 浩久 和里田; 克己 因幡; 弘之 小路; 雅和 池田; 直樹 福永; 満 鞠山
Archive | 1995
Masaru Kubo; Naoki Fukunaga; Motohiko Yamamoto
Archive | 1997
Takahiro Takimoto; Naoki Fukunaga; Masaru Kubo
Archive | 2002
Takahiro Takimoto; Naoki Fukunaga; Isamu Ohkubo; Toshimitsu Kasamatsu; Mutsumi Oka; Masaru Kubo
Archive | 2000
Makoto Hosokawa; Naoki Fukunaga; Takahiro Takimoto; Masaru Kubo; Toshihiko Fukushima; Isamu Ohkubo
Archive | 1996
Naoki Fukunaga; Takahiro Takimoto; 貴博 瀧本; 直樹 福永
Archive | 1999
Naoki Fukunaga; Toshimitsu Kasamatsu; Masaru Kubo; Isamu Ohkubo; Mutsumi Oka; Takahiro Takimoto