Nicholas Barbosa
Lehigh University
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Publication
Featured researches published by Nicholas Barbosa.
MRS Proceedings | 2003
Nicholas Barbosa; Paul El-Deiry; Richard P. Vinci
Free-standing Al thin films were loaded statically and dynamically through the use of a custom-built microtensile system. The system is capable of performing monotonic loading/unloading up to 50 μm/s (10 -1 /s) and tension-tension fatigue experiments at 100 Hz on 600 μm long, 100 μm wide, and 1 μm thick free-standing Al microtensile beams. Monotonic loading/unloading and stress relaxation experiments have been performed. The microtensile beams show plasticity as well as a relaxation dependence on strain rate and stress level. Displacement controlled tension-tension fatigue experiments have also been performed. A trend of decreasing cycles to failure with increasing displacement amplitude and increasing mean displacement has been noted but requires further experimental exploration.
symposium on design test integration and packaging of mems moems | 2006
Ming-Tzer Lin; Paul El-Deiry; Richard R. Chromik; Nicholas Barbosa; Walter L. Brown; Terry J. Delph; Richard P. Vinci
Thin Solid Films | 2007
Ming-Tzer Lin; Richard R. Chromik; Nicholas Barbosa; Paul El-Deiry; Seungmin Hyun; Walter L. Brown; Richard P. Vinci; Terry J. Delph
MRS Proceedings | 2011
David Read; Nicholas Barbosa
Advanced Metallization Conf. | 2005
Robert R. Keller; Cynthia A. Volkert; Roy H. Geiss; Andrew J. Slifka; David T. Read; Nicholas Barbosa; Reiner Mönig
NIST Interagency/Internal Report (NISTIR) - 8182 | 2018
Li-Anne Liew; David T. Read; Ryan White; Nicholas Barbosa
Materials Research Express | 2018
David T. Read; Li-Anne Liew; Ryan White; Nicholas Barbosa; John Geaney
Additional Conferences (Device Packaging, HiTEC, HiTEN, & CICMT) | 2015
Li-Anne Liew; David T. Read; Nicholas Barbosa
Additional Conferences (Device Packaging, HiTEC, HiTEN, & CICMT) | 2014
Li-Anne Liew; David T. Read; Nicholas Barbosa
23rd International Offshore (Ocean) and Polar Engineering Conference | 2013
Elizabeth S. Drexler; Andrew J. Slifka; Robert L. Amaro; Nicholas Barbosa; Damian S. Lauria; Louis E. Hayden; Douglas G. Stalheim