Nobutaka Shioya

Comprehensive Understanding of Structure-Controlling Factors of a Zinc Tetraphenylporphyrin Thin Film Using pMAIRS and GIXD Techniques

The performance of an organic electronic device is significantly influenced by the anisotropic molecular structure in the film, which has long been difficult to predict especially for a solution process. In the present study, a zinc tetraphenylporphyrin (ZnTPP) thin film prepared by a solution process was chosen to comprehensively explore the molecular-arrangement mechanism as a function of representative film-preparation parameters: solvent, film-preparation technique, and thermal annealing. The anisotropic structure was first analyzed by using a combination of infrared p-polarized multiple-angle incidence resolution spectrometry (pMAIRS) and grazing incidence X-ray diffraction (GIXD), which readily revealed the molecular orientation and crystal structure, respectively. As a result, the real dominant factor was found to be the evaporation time of the solvent that determines the initial two different molecular arrangements, types-I and -II, while the thermal annealing was found to play an additional role of improving the molecular order. The correlation between the molecular orientation and the crystal structure was also revealed through the individual orientation analysis of the porphyrin and phenyl rings.

Optimal Experimental Condition of IR pMAIRS Calibrated by Using an Optically Isotropic Thin Film Exhibiting the Berreman Effect.

Infrared (IR) p-polarized multiple-angle incidence resolution spectrometry (pMAIRS) is a useful spectroscopic tool for revealing the molecular anisotropic structure in a thin film, which is used for the molecular orientation analysis of many functionalized organic thin films. Infrared pMAIRS provides both in-plane (IP) and out-of-plane (OP) vibrational mode spectra, which are influenced by the choice of the angles of incidence, i.e., angle set. To obtain quantitatively reliable pMAIRS spectra, therefore, the optimal angle set must be revealed. In a former study, an optimization study was carried out on a silicon substrate by using the band intensity ratio of the IP and OP spectra of highly oriented molecules in a thin film, which has a problem that the optimized results cannot be used for another substrate. In the present study, a totally new idea using an optically isotropic thin film as a standard sample is proposed to comprehensively explore the optimal angle set on various substrates: the band shift due to the Berreman effect of a strongly absorbing compound is used, instead of the band intensity. This new approach makes the pMAIRS calibration for various substrates a much easier task. With the optimal angle set, the molecular orientation angle in the film calculated by the pMAIRS spectra is also found to be reliable quantitatively. This technique opens a user-friendly way to a reliable molecular orientation analysis in an ultrathin film using IR pMAIRS.

Accurate Molecular Orientation Analysis Using Infrared pMAIRS Considering the Refractive Index of the Thin Film Sample

Infrared (IR) p-polarized multiple-angle incidence resolution spectrometry (pMAIRS) is a powerful tool for analyzing the molecular orientation in an organic thin film. In particular, pMAIRS works powerfully for a thin film with a highly rough surface irrespective of degree of the crystallinity. Recently, the optimal experimental condition has comprehensively been revealed, with which the accuracy of the analytical results has largely been improved. Regardless, some unresolved matters still remain. A structurally isotropic sample, for example, yields different peak intensities in the in-plane and out-of-plane spectra. In the present study, this effect is shown to be due to the refractive index of the sample film and a correction factor has been developed using rigorous theoretical methods. As a result, with the use of the correction factor, organic materials having atypical refractive indices such as perfluoroalkyl compounds (n = 1.35) and fullerene (n = 1.83) can be analyzed with high accuracy comparable to a compound having a normal refractive index of approximately 1.55. With this improved technique, we are also ready for discriminating an isotropic structure from an oriented sample having the magic angle of 54.7°.

Fringe and Noise Reductions of pMAIRS Spectra Using Principal Component Analysis

Infrared p-polarized multiple-angle incidence resolution spectrometry (pMAIRS) is a promising analytical tool for revealing the molecular orientation quantitatively of each chemical group in a thin film even with surface roughness. The spectra are often disturbed by noise and fringe, however, due to the multiple reflections in the substrate and the film, which makes the quantitative analysis very difficult. Therefore, improvement of the signal to noise (SN) ratio of the spectra is expected. Principal component analysis (PCA), in the present study, is first applied to the noise reduction for pMAIRS spectra of a poly(3-hexylthiophene) spin-coated thin film by employing the spin-speed as the experimental parameter. As a result, high quality pMAIRS spectra are readily obtained, with which highly reliable quantitative discussion is made.