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Dive into the research topics where Noriaki Shimodaira is active.

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Featured researches published by Noriaki Shimodaira.


Journal of Applied Physics | 2002

Raman spectra of fluorine-doped silica glasses with various fictive temperatures

Noriaki Shimodaira; Kazuya Saito; Akira J. Ikushima

We have demonstrated the change of the Raman spectra in F-doped silica glasses with various fictive temperatures, and have also presented a useful peak-deconvolution technique for evaluating the relative concentration of D1 and D2 bands that could be attributed to four- and three-membered ring structures. The intensities of D1 and D2 bands are mainly dominated by the fictive temperature, and they are not almost affected by the F content at the same fictive temperature. It has been made clear that the intensity of D1 band as well as D2 band has a linear relationship with the IR peak position around 2260 cm−1 that is correlated with the average Si–O–Si bond angle, irrespective of the F content. The “activation energies” of D1 and D2, estimated from the Arrhenius plot, are 0.26 and 0.41 eV, respectively.


Applied Physics Letters | 2005

Refractive index and density in F- and Cl-doped silica glasses

Hiroshi Kakiuchida; Noriaki Shimodaira; Edson H. Sekiya; Kazuya Saito; Akira J. Ikushima

The refractive index and density of fluorine- and chlorine-doped silica glasses were measured as functions of fictive temperature. The halogen concentrations were observed to have a refractive index or density that is independent of the fictive temperature were found. This implies that these properties are not affected by any heat-treatment conditions.


Proceedings of SPIE, the International Society for Optical Engineering | 2000

VUV transmittance of fused silica glass influenced by thermal disorder

Noriaki Shimodaira; Kazuya Saito; Akira J. Ikushima; Toru Kamihori; Shuhei Yoshizawa

The technological development of projection photolithography at the 157 nm wavelength of the F2 laser followed by the 193 nm of the ArF excimer laser has been progressing rapidly. Fused silica glass is most promising candidate for 157 nm photomasks, while its absorption edge is extremely close to 157 nm. In this paper the vacuum,-UV transmittance curve at temperatures of 298 to 498 K was examined. The curve gradually shift to longer wavelengths due to thermal disorder and the transmittance at 157nm decreased with increasing temperature. The rise in temperature induced by F2 laser energy density and the irradiation time. For examples, in the case of 0.9 internal transmittance and a fluence of 0.1 mJ/cm(superscript 2/pulse with 1 kHz frequency, the temperature raised by about 8K. The change of transmittance at 157 nm accompanying the increment of 8K is negligibly small. The data suggests that the transmission loss caused by thermal disorder during F2 laser irradiation can be neglected as long as the silica glass with high internal transmittance is used in 157 nm photomasks.


Archive | 1999

Synthetic quartz glass and method for production thereof

Yoshiaki Ikuta; Shinya Kikugawa; Noriaki Shimodaira; Akio Masui; Shuhei Yoshizawa


Archive | 2003

Wavelength-selective diffraction element and an optical head device

Ryuichiro Goto; Hiroki Hotaka; Yoshiharu Ooi; Reiko Nozawa; Noriaki Shimodaira; Ryota Murakami


Archive | 2006

PROCESS FOR PRODUCING SILICA GLASS CONTAINING TiO2, AND OPTICAL MATERIAL FOR EUV LITHOGRAPHY EMPLOYING SILICA GLASS CONTAINING TiO2

Akio Koike; Yasutomi Iwahashi; Noriaki Shimodaira; Shinya Kikugawa; Naoki Sugimoto


Archive | 2011

METHOD FOR MANUFACTURING GLASS SUBSTRATE FOR MAGNETIC RECORDING MEDIUM

Takeaki Ono; Noriaki Shimodaira


Archive | 1998

Electric double layer capacitor, and carbon material and electrode therefor

Noriaki Shimodaira; Takeshi Kawasato; Kazuya Hiratsuka; Manabu Suhara; Manabu Tsushima


Archive | 2000

Synthetic quartz glass for optical member, process for producing the same, and method of using the same

Shinya Kikugawa; Yoshiaki Ikuta; Akio Masui; Noriaki Shimodaira; Shuhei Yoshizawa


Archive | 2002

Synthetic silica glass optical component and process for its production

Yoshiaki Ikuta; Shinya Kikugawa; Akio Masui; Noriaki Shimodaira; Shuhei Yoshizawa

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Yoshiaki Ikuta

Tokyo Institute of Technology

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Akira J. Ikushima

Toyota Technological Institute

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Kazuya Saito

Toyota Technological Institute

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H. Hosono

Tokyo Metropolitan University

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