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Norio Ishitsuka

Hitachi

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Publication

Featured researches published by Norio Ishitsuka.

Archive | 1991

Semiconductor apparatus and semiconductor package

Hiroyuki Ohta; Norio Ishitsuka; Akihiro Yaguchi; Sueo Kawai; Nobuo Owada; Shigeki Hirasawa

Archive | 2003

Semiconductor integrated circuit device and method of manufacturing involving the scale-down width of shallow groove isolation using round processing

Norio Suzuki; Hiroyuki Ichizoe; Masayuki Kojima; Keiji Okamoto; Shinichi Horibe; Kozo Watanabe; Yasuko Yoshida; Shuji Ikeda; Akira Takamatsu; Norio Ishitsuka; Atsushi Ogishima; Maki Shimoda

Archive | 2001

Semiconductor device and process for producing the sme

Norio Ishitsuka; Hideo Miura; Shuji Ikeda; Norio Suzuki; Yasushi Matsuda; Yasuko Yoshida; Hirohiko Yamamoto; Masamichi Kobayashi; Akira Takamatsu; Hirofumi Shimizu; Kazushi Fukuda; Shinichi Horibe; Toshio Nozoe

Archive | 2007

DIELECTRIC MATERIAL SEPARATED-TYPE, HIGH BREAKDOWN VOLTAGE SEMICONDUCTOR CIRCUIT DEVICE, AND PRODUCTION METHOD THEREOF

Atsuo Watanabe; Mitsutoshi Honda; Norio Ishitsuka; Masahiro Ito; Toshihito Tabata; Shinichi Kurita; Hidekazu Kamioka

JSME international journal. Series A, mechanics and material engineering | 1996

Stress Analysis of Transistor Structures Considering the Internal Stress of Thin Films

Hideo Miura; Norio Ishitsuka; Naoto Saito; Hiroyuki Ohta; Chiemi Hashimoto; Shuji Ikeda

Archive | 1999

Method of forming a shallow groove isolation structure

Norio Ishitsuka; Hideo Miura; Shuji Ikeda; Yasuko Yoshida; Norio Suzuki; Michimasa Funabashi

Archive | 2003

Process for producing semiconductor device and semiconductor device produced thereby

Norio Ishitsuka; Hideo Miura; Shuji Ikeda; Yasuko Yoshida; Norio Suzuki; Kozo Watanabe; Kenji Kanamitsu

Archive | 2010

High breakdown voltage semiconductor integrated circuit device and dielectric separation type semiconductor device

Atsuo Watanabe; Hidekazu Kamioka; Mitsutoshi Honda; Norio Ishitsuka; Masahiro Ito; Toshihito Tabata; Shinichi Kurita

Jsme International Journal Series A-solid Mechanics and Material Engineering | 1998

Molecular dynamics study of stress effects on Raman frequencies of crystalline silicon

Tomio Iwasaki; Naoya Sasaki; Hiroshi Moriya; Hideo Miura; Norio Ishitsuka

Transactions of the Japan Society of Mechanical Engineers. A | 1996

Development of Apparatus for Measuring Stress in Semiconductor Devices by Applying Microscopic Raman Spectroscopy Using an Ultraviolet Laser.

Norio Ishitsuka; Hiroshi Sakata; Asao Nishimura; Hideo Miura; Tetsuo Kumazawa

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Shuji Ikeda

Hitachi

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Hideo Miura

Tohoku University

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Norio Suzuki

Japan Atomic Energy Research Institute

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Yasuko Yoshida

Hitachi

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Hideo Miura

Tohoku University

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Masatoshi Ogata

Hitachi

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Shinichi Horibe

Hitachi

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Naoto Saito

Hitachi

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Akira Takamatsu

Renesas Electronics

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Atsuo Watanabe

Hitachi

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