Network


Latest external collaboration on country level. Dive into details by clicking on the dots.

Hotspot


Dive into the research topics where O.C. Anude is active.

Publication


Featured researches published by O.C. Anude.


International Journal of Reliability, Quality and Safety Engineering | 1994

COMMON-CAUSE FAILURES IN ENGINEERING SYSTEMS: A REVIEW

Balbir S. Dhillon; O.C. Anude

This paper reviews selected published literature on common-cause failures. These publications have been collected from conference proceedings, engineering reliability and safety journals, textbooks etc. The collected literature is grouped into several categories and a comprehensive list of references is presented.


Microelectronics Reliability | 1993

Robot safety and reliability: A review

Balbir S. Dhillon; O.C. Anude

Abstract This article reviews selective literature on Robot Safety and Reliability. The litterature is obtained mainly from journals and conference proceedings of the leading world robotic associations and has been classified into three broad categories: Robot Reliability; Robot Safety and Maintenance; and General. The General category includes articles that touched on elements of both Robot Reliability and Robot Safety and Maintenance. Tables are developed in conjunction with this review and a comprehensive list of references is provided.


Microelectronics Reliability | 1993

Common-cause failure analysis of a parallel system with warm standby

Balbir S. Dhillon; O.C. Anude

Abstract This paper presents the reliability analysis of a two identical unit parallel system with a warm standby subject to common-cause failures. The expressions and plots of system reliability, availability, mean time to failure and variance of time to failure of the system are presented. A general formular for the system steady-state availability is developed when failed system repair times are gamma distributed.


Microelectronics Reliability | 1993

Common-cause failure analysis of a non-identical unit parallel system with arbitrarily distributed repair times

Balbir S. Dhillon; O.C. Anude

Abstract This paper presents common-cause failure analysis of a two non-identical unit parallel system with arbitrarily distributed repair times. Laplace transforms of state probability equations are developed by using the supplementary variable technique. A general formular for the system steady-state availability is developed for gamma distributed repair times. Time-dependent availability analysis is presented for the case when failed system repair times are gamma distributed with β = 2.


Microelectronics Reliability | 1994

Income optimization of a repairable and redundant system

Balbir S. Dhillon; O.C. Anude

Abstract This paper presents income optimization analysis of a repairable system composed to two units in parallel and one warm standby. System long term availability expression is developed using the supplementary variable technique and Laplace transforms, and Abels theorem. The system income optimization analysis is performed using the differential calculus-based approach. Several related plots are shown.


International Journal of Systems Science | 1994

Common-cause failure analysis of a redundant system with repairable units

Balbir S. Dhillon; O.C. Anude

A newly developed general expression for the mean time to failure of a parallel system of repairable identical units with warm standby and common-cause failures is presented. Generalized expressions for system reliability and variance of time to failure are also presented along with some special case model formulae


Microelectronics Reliability | 1994

Optimizing the income of a repairable reliability system with early standby activation

Balbir S. Dhillon; O.C. Anude

Abstract This paper presents optimization analysis concerned with the income of a repairable reliability system having two identical units in parallel and one standby with common-cause failures. Expressions to obtain optimun net income of the system with respect to repair are developed. Several plots of resulting expressions are shown.


Microelectronics Reliability | 1994

Common-cause failure analysis of a k-out-of-n:G system with repairable units

Balbir S. Dhillon; O.C. Anude

Abstract A newly developed generalized expression for the mean time to failure of a k-out-of-n: G system composed of repairable units and subject to common-cause failures is presented. Also, reported are some special case system reliability and variance of time to failure formulas.


Microelectronics Reliability | 1992

Mining equipment reliability : a review

Balbir S. Dhillon; O.C. Anude

Abstract This paper reviews selected literature on mining equipment reliability. The literature is collected mainly from journals and conference proceedings and has been classified into several categories. Tables and a chart are developed in conjunction with this review. An extensive list of references is presented.


International Journal of Systems Science | 1995

Common-cause failure analysis of a k-out-of-n:G system with non-repairable units

Balbir S. Dhillon; O.C. Anude

Abstract A newly developed expression for the mean time to failure, MTTF k/n , of a non-repairable k-out-of-n : G identical unit system with warm standby and common-cause failures is presented. A modified version of this formula, (which takes into consideration the repairability of the warm stand-by) and the system reliability and variance of time-to-failure expressions for some special cases, are also reported.

Collaboration


Dive into the O.C. Anude's collaboration.

Top Co-Authors

Avatar
Researchain Logo
Decentralizing Knowledge