Ohlhoff Carsten | Researchain

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Archive | 2001

Configuration for measurement of internal voltages in an integrated semiconductor apparatus, using comparator connected to reference voltage

Beer Peter; Ohlhoff Carsten

Archive | 2001

Arrangement for trimming reference voltages in semiconducting chips enables rapid and cost-effective reference voltage trimming

Ohlhoff Carsten

Archive | 2001

Memory component with test mode has address circuit that activates defective memory cell instead of specified replacement cell if signal from test circuit and address of defective cell applied

Beer Peter; Ohlhoff Carsten

Archive | 2001

Integrierte Schaltung mit einer Strommesseinheit und ein Verfahren zum Messen eines Stromes

Ohlhoff Carsten; Beer Peter

Archive | 2003

Integrated memory has inverter stage between first (read) and second (write) data paths that activates memory in test mode and connects first and second data paths together in activated state

Ohlhoff Carsten

Archive | 2003

Halbleiter-Chip mit trimmbarem Oszillator

Ohlhoff Carsten; Beer Peter

Archive | 2004

Memory module, test system and method for testing one and complex number memory module

Beer Peter; Ohlhoff Carsten

Archive | 2004

Testschaltung und Verfahren zum Testen einer integrierten Speicherschaltung

Ohlhoff Carsten; Beer Peter

Archive | 2003

Speicherbaustein mit verbesserten elektrischen Eigenschaften

Beer Peter; Ohlhoff Carsten; Schneider Helmut

Archive | 2003

Memory circuit testing device has failed addresses received from memory circuit interface stored in different memory cells dependent on their data rate

Ohlhoff Carsten; Beer Peter

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