Network


Latest external collaboration on country level. Dive into details by clicking on the dots.

Hotspot


Dive into the research topics where Oka Kenji is active.

Publication


Featured researches published by Oka Kenji.


Archive | 2003

METHOD AND DEVICE FOR INSPECTING DEFECT OF PATTERN

Maeda Shunji; Nakayama Yasuhiko; Yoshida Minoru; Oka Kenji; Kubota Hitoshi


Archive | 2001

METHOD AND DEVICE FOR PROCESSING INSPECTION DATA

Maeda Shunji; Yoshitake Yasuhiro; Oka Kenji; Shimoda Atsushi; Shiba Masataka


Archive | 2000

INSPECTION DATA PROCESSING METHOD, AND INSPECTION DATA PROCESSOR

Maeda Shunji; Yoshitake Yasuhiro; Oka Kenji


Archive | 1999

APPARATUS AND METHOD FOR INSPECTING PATTERN ON CHIP

Nakayama Yasuhiko; Maeda Shunji; Oka Kenji; Makihira Hiroshi; Yoshida Minoru; Shibata Yukihiro


Archive | 2000

DEFECT INSPECTION METHOD FOR PATTERN AND ITS DEVICE

Maeda Shunji; Yoshida Atsushi; Oka Kenji; Yoshida Minoru; Shibata Yukihiro; Yamaguchi Kazuo


Archive | 1999

OPTICAL DEFECT-INSPECTION DEVICE

Yoshida Atsushi; Maeda Shunji; Yamaguchi Kazuo; Yoshida Minoru; Shibata Yukihiro; Oka Kenji


Archive | 2000

YIELD PREDICTING METHOD AND APPARATUS THEREOF, AND MANUFACTURE OF SUBSTRATE

Matsumoto Shunichi; Noguchi Minoru; Maeda Shunji; Oka Kenji; Watanabe Kenji


Archive | 1997

METHOD AND APPARATUS FOR EVALUATION OF INSPECTION PERFORMANCE OF PATTERN INSPECTION DEVICE

Nakayama Yasuhiko; Maeda Shunji; Yoshida Minoru; Kubota Hitoshi; Oka Kenji; Makihira Hiroshi


Archive | 1996

STAGE INSPECTION DEVICE AND ITS METHOD

Yoshida Minoru; Oka Kenji; Maeda Shunji; Kubota Hitoshi; Nakayama Yasuhiko


Archive | 1996

PATTERN INSPECTION DEVICE AND ITS METHOD

Nakayama Yasuhiko; Maeda Shunji; Yoshida Minoru; Kubota Hitoshi; Oka Kenji

Collaboration


Dive into the Oka Kenji's collaboration.

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