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Dive into the research topics where Oleg M. Barabash is active.

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Featured researches published by Oleg M. Barabash.


Micron | 2009

Polychromatic Microdiffraction Characterization of Defect Gradients in Severely-Deformed Materials

Rozaliya Barabash; Gene E. Ice; Wenjun Liu; Oleg M. Barabash

This paper analyzes local lattice rotations introduced in severely deformed polycrystalline titanium by friction stir welding. Nondestructive three-dimensional (3D) spatially resolved polychromatic X-ray microdiffraction, is used to resolve the local crystal structure of the restructured surface from neighboring local structures in the sample material. The measurements reveal strong gradients of strain and geometrically necessary dislocations near the surface and illustrate the potential of polychromatic microdiffraction for the study of deformation in complex materials systems.


Journal of Applied Physics | 2006

Spatially resolved distribution of dislocations and crystallographic tilts in GaN layers grown on Si(111) substrates by maskless cantilever epitaxy

Rozaliya Barabash; C. Roder; Gene E. Ice; S. Einfeldt; J. D. Budai; Oleg M. Barabash; S. Figge; D. Hommel

The spatial distribution of strain, misfit and threading dislocations, and crystallographic orientation in uncoalesced GaN layers grown on Si(111) substrates by maskless cantilever epitaxy was studied by polychromatic x-ray microdiffraction, high resolution monochromatic x-ray diffraction, and scanning electron microscopy. Tilt boundaries formed at the column/wing interface depending on the growth conditions. A higher lateral to vertical growth ratio suppressed sidewall deposition and was found to produce larger lattice tilts in the GaN films. Two kinds of crystallographic tilts are observed in the films. The measurements revealed that the free-hanging wings are tilted upward at room temperature in the direction perpendicular to the stripes. Finite element simulations of the thermally induced part of the wing tilt are presented. Moreover, a misorientation between the GaN(0001) and the Si(111) planes is observed in the parallel to the stripe direction. Its origin is discussed with respect to the strain of ...


Journal of Applied Physics | 2004

Evolution of dislocation structure in the heat affected zone of a nickel-based single crystal

Oleg M. Barabash; J. A. Horton; S. S. Babu; J.M. Vitek; S. A. David; J.W. Park; Gene E. Ice; Rozaliya Barabash

Using polychromatic microbeam synchrotron diffraction together with electron and optical microscopy, we studied dislocation structure changes of Ni—based single crystal superalloy during impulse heating up to the melting temperature. It is shown that the distribution of the thermal gradient is not monotonic. The maximum value of the thermal gradient is observed in the heat affected zone near the fusion line. Depending on the temperature, the formation of dislocation is accompanied by the partial or complete dissolution of γ′ particles in the matrix. Dislocations form and multiply due to thermal gradients, and their arrangement correlates with temperature gradient field and with the dissolution and reprecipitation of γ′ particles.


Journal of Applied Physics | 2003

Deformation in the heat affected zone during spot welding of a nickel-based single crystal

Oleg M. Barabash; S. S. Babu; S. A. David; J.M. Vitek; Rozaliya Barabash

Constrained melting and solidification and associated thermal cycling during welding produces extensive microstructural changes. Such changes are observed during spot welding of single-crystal Ni-based superalloy TSM-75. Analysis of Laue diffraction patterns attained from the heat-affected-zone indicates the presence of a high density of dislocations. Dislocation rearrangement results in local rotations around the [100] direction, which is perpendicular to the temperature gradient. These dislocations exist over a large fraction of the heat-affected zone. The analyses also showed that the dislocation density was maximal near the fusion line and gradually decreases with an increase in the distance from the fusion line. The dislocation density increased with the cooling rate.


Applied Physics Letters | 2013

In-situ observation of stress-induced stochastic twin boundary motion in off stoichiometric NiMnGa single crystals

Rozaliya Barabash; Christoph Kirchlechner; Odile Robach; Olivier Ulrich; Jean-Sébastien Micha; Alexei Sozinov; Oleg M. Barabash

In-situ X-ray microdiffraction is used to illuminate the physics of non-uniform stochastic motion of type II twin boundaries in NiMnGa twinned crystals during external stress field loading. Asymmetry between tensile and compressive loading and a large hysteresis loop were found. The formation of local strained regions precedes each boundary movement. The location of strained regions adjusts to the position of the twin boundary. Abrupt motion of the boundary correlates with corresponding spikes at the load/displacement curve.


International Journal of Plasticity | 2009

X-ray microdiffraction and strain gradient crystal plasticity studies of geometrically necessary dislocations near a Ni bicrystal grain boundary

Tetsuya Ohashi; Rozaliya Barabash; Judy Pang; Gene E. Ice; Oleg M. Barabash


Materials Science and Engineering A-structural Materials Properties Microstructure and Processing | 2009

X-ray microdiffraction and EBSD study of FSP induced structural/phase transitions in a Ni-based superalloy

Oleg M. Barabash; Rozaliya Barabash; Gene E. Ice; Zhili Feng; David Gandy


Materials Science and Engineering A-structural Materials Properties Microstructure and Processing | 2010

Mapping strain gradients in the FIB-structured InGaN/GaN multilayered films with 3D x-ray microbeam.

Rozaliya Barabash; Yanfei Gao; Gene E. Ice; Oleg M. Barabash; Jin-Seok Chung; Wenjun Liu; R. Kröger; H. Lohmeyer; K. Sebald; J. Gutowski; T. Böttcher; D. Hommel


Reviews on Advanced Materials Science | 2007

X-RAY MICROBEAM CHARACTERIZATION OF THE NEAR SURFACE NANOSTRUCTURED LAYER IN Ti AFTER FRICTION STIR PROCESSING

Rozaliya Barabash; Oleg M. Barabash; Gene E. Ice; S. A. David; Zhili Feng; J. A. Horton


Physica Status Solidi (a) | 2006

Characterization of Crystallographic Properties and Defects VIA X-ray Microdiffraction in GaN (0001) Layers

Rozaliya Barabash; Oleg M. Barabash; Gene E. Ice; C. Roder; S. Figge; S. Einfeldt; D. Hommel; T. M. Katona; James S. Speck; S. P. DenBaars; Robert F. Davis

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Rozaliya Barabash

Oak Ridge National Laboratory

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Gene E. Ice

Oak Ridge National Laboratory

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S. A. David

Oak Ridge National Laboratory

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J.M. Vitek

Oak Ridge National Laboratory

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J. A. Horton

Oak Ridge National Laboratory

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S. S. Babu

University of Tennessee

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Wenjun Liu

Argonne National Laboratory

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C. Roder

University of Bremen

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D. Hommel

Oak Ridge National Laboratory

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S. Einfeldt

Ferdinand-Braun-Institut

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