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Publication


Featured researches published by Otaka Tadashi.


Archive | 2007

SAMPLE IMAGE FORMING METHOD AND CHARGED PARTICLE BEAM DEVICE

Sato Mitsugi; Takane Atsushi; Iiizumi Takashi; Otaka Tadashi; Todokoro Hideo; Yamaguchi Satoshi; Futamura Kazutaka


Archive | 2003

LENGTH MEASURING METHOD FOR SAMPLE AND SACCNING MICROSCOPE

Shimoma Goroku; Otaka Tadashi; Sato Mitsugi; Todokoro Hideo; Watanabe Shunichi; Takahashi Tadanori; Kawakazu Masahiro; Gunji Masanori; Nishino Terumichi


Archive | 2002

ADJUSTING METHOD OF CHARGED PARTICLE BEAM, AND CHARGED PARTICLE BEAM SYSTEM

Sato Mitsugi; Otaka Tadashi; Esumi Makoto; Takane Atsushi; Yoshida Masashi


Archive | 1992

SCANNING ELECTRON MICROSCOPE AND MANUFACTURE OF SEMICONDUCTOR ELEMENT BY IT

Todokoro Hideo; Takamoto Kenji; Otaka Tadashi


Archive | 2005

IMAGE EVALUATING METHOD AND MICROSCOPE

Ishitani Toru; Sato Mitsugi; Todokoro Hideo; Otaka Tadashi; Iiizumi Takashi; Takane Atsushi


Archive | 2005

MEASURING TECHNIQUE OF SAMPLE DIMENSION AND SCANNING ELECTRON MICROSCOPE

Nasu Osamu; Kawada Hiroki; Otaka Tadashi; Fukaya Ritsuo; Esumi Makoto


Archive | 2004

MONOCHROMATOR AND SCANNING ELECTRON MICROSCOPE WITH MONOCHROMATOR

Ose Yoichi; Taya Toshimichi; Todokoro Hideo; Otaka Tadashi; Sato Mitsugi; Esumi Makoto


Archive | 2003

SCANNING ELECTRON MICROSCOPE WITH MONOCHROMATOR

Taya Toshimichi; Otaka Tadashi; Obara Atsushi; Ose Yoichi; Todokoro Hideo


Archive | 1998

CHARGED PARTICLE MICROSCOPE OF SCAN TYPE

Yoshimura Toshiyuki; Todokoro Hideo; Esumi Makoto; Otaka Tadashi; Yamamoto Jiro; Terasawa Tsuneo


Archive | 1995

OBSERVING METHOD OF SEMICONDUCTOR ELEMENT, AND SCANNING ELECTRON MICROSCOPE USED THEREFOR

Todokoro Hideo; Kubo Toshio; Terakado Sadao; Otaka Tadashi

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