Ou Xiyang
Electric Power Research Institute
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Publication
Featured researches published by Ou Xiyang.
2014 IEEE Workshop on Electronics, Computer and Applications (IWECA) | 2014
Ji Jing; Hou Xingzhe; Zheng Ke; Ou Xiyang
Currently, parts stress method is the most suitable and practical method for smart meters reliability prediction, and SR-332 handbook based on parts stress method has been widely applied on the international commercial standard. This paper establishes the components and meters failure rate models based on SR-332 handbook, deduces the sensitivity models of components temperature stress factor, electrical stress factor and smart meter failure rate to ambient temperature and electrical stress level, then analyzes the change rule of sensitivity.
Archive | 2014
Ou Xiyang; Hou Xingzhe; Zhou Kongjun; Li Linxia; Zheng Ke; Wu Hua; Sun Hongliang; Feng Ling; Hu Xiaorui
Archive | 2013
He Jianjun; Hou Xingzhe; Ou Xiyang; Zheng Ke; Zhou Quan; Li Linxia; Wu Hua; Hu Xiaorui; Hu Tianlian; Wu Jian; Chen Gang
Archive | 2013
He Jianjun; Hou Xingzhe; Ou Xiyang; Zheng Ke; Zhou Quan; Li Linxia; Wu Hua; Hu Xiaorui; Hu Tianlian; Wu Jian; Chen Gang
Archive | 2012
Ou Xiyang; Hou Xingzhe; Zheng Ke; Zhou Quan; Li Linxia; Wu Hua; Feng Ling; Sun Hongliang; Liu Yongxiang
Archive | 2012
He Jianjun; Ou Xiyang; Hou Xingzhe; Zheng Ke; Zhou Quan; Li Linxia; Wu Hua; Chen Gang; Hu Tianlian; Liang Yanyang; Wu Jian; Hu Xiaorui
Archive | 2017
Zheng Ke; Hou Xingzhe; Liu Xingzhi; Ou Xiyang; Gong Lin; Zhou Li; Wang Yabin; Chen Wenli; Yang Fuli; Tao Xuedan; Liu Chang; Yang Guanghui
Archive | 2016
Ou Xiyang; Tang Xiaoze; Hou Xingzhe; Zhou Kongjun; Zhou Quan; He Bei; Zheng Ke; Liu Xingzhi; Lin Wei; Wei Lin; Zhang Jin; Yang Fuli
Archive | 2016
Ou Xiyang; Hou Xingzhe; Zeng Yousong; Wang Xinhua; Zhou Kongjun; Zhou Quan; Li Xiangyou; Zhang Jin; Ji Chang; Zhu Ying; Yang Hui; Chen Jian; Zhan Zifei
Archive | 2014
Ou Xiyang; Liu Ran; Hou Xingzhe; Zheng Ke; Fu Zhihong; Hu Xiaorui; Zhang Xiaoyong; Zhang Huaiqing; Ji Jing; Wu Hua; Sun Hongliang
