P. Klimanek

Substructure analysis in polycrystalline materials by means of neutron diffraction

Abstract Angle-dispersive high-resolution neutron diffraction was used for the analysis of diffraction-line broadening due to deformation-induced substructures in FCC and BCC metallic materials. The results are in good agreement with those of X-ray analysis, in addition neutron diffraction also permits the non-destructive investigation of substructure gradients in bulk specimens.

Application of RTOF for integrated substructure analysis in polycrystalline materials

Abstract Integrated substructure analysis in polycrystals is often based on the interpretation of physical diffraction-line broadening. In the present work the case of high-resolution neutron diffraction by means of RTOF is considered in comparison with the angular-dispersive neutron diffractometry. First experimental results indicate that RTOF can successfully be used for the determination of physical line-broadening.

Plastically deformed beryllium blades for neutron monochromator construction

Abstract Deformation of thin beryllium blades by plastic bending seems to be a promising way to construct a stacked neutron monochromator of high reflectivity. A 0.60° broad 11 2 0 reflection with a maximum reflectivity of 38% was reached with a 6 mm thick package of deformed blades at a neutron wavelength of 1.15 A. Since the measured values are smaller than the theoretical values, primary extinction is not negligible. This can be explained by the deformation mode applied. An attempt to solve this problem is proposed.

Investigation of Residual Strains of the Second Kind in Plastically Deformed Metallic Materials

Investigation of strongly distorted crystal structures caused by dislocations, stacking-faults etc. in both plastically deformed f.c.c. and b.c.c. metallic materials was performed by the analysis of the neutron diffraction line broadening. Measurements were realized by means of the high resolution triple-axis neutron diffractometer equipped by bent Si perfect crystals as monochromator and analyzer at the NPI Rez. The substructure parameters obtained in this manner are in good agreement with the results of X-ray diffraction analysis.

Microstructure characterization in electrodeposited Cu-coatings obtained at different bath temperatures

X-ray profile and texture analysis, optical microscopy and microhardness measurement were used in order to study the dependence of the microstructure formation of electrodeposited copper coatings on the bath temperature. The coatings were obtained from an acid electrolyte without any additions within a temperature range from -10 o C up to 110 o C on polycrystalline copper and amorphous carbon substrates. The obtained temperature dependence of dislocation density is similar to that of the microhardness. Above room temperature the lattice perfection and the main grain size rapidly increase. At all temperatures deposition on carbon leads to a -fibre texture, but on copper substrates a texture change of the coatings from a -fibre to a more complicated, substrate-related epitaxial texture was observed