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Dive into the research topics where P. N. First is active.

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Featured researches published by P. N. First.


Applied Physics Letters | 2006

Highly ordered graphene for two dimensional electronics

J. Hass; Rui Feng; Tianbo Li; Xuebin Li; Z. Zong; W. A. de Heer; P. N. First; Edward H. Conrad; C.A. Jeffrey; Claire Berger

With expanding interest in graphene-based electronics, it is crucial that high quality graphene films be grown. Sublimation of Si from the 4H-SiC(0001) (Si-terminated) surface in ultrahigh vacuum is a demonstrated method to produce epitaxial graphene sheets on a semiconductor. In this letter the authors show that graphene grown from the SiC(0001¯) (C-terminated) surface are of higher quality than those previously grown on SiC(0001). Graphene grown on the C face can have structural domain sizes more than three times larger than those grown on the Si face while at the same time reducing SiC substrate disorder from sublimation by an order of magnitude.


Physical Review B | 2007

Imaging the interface of epitaxial graphene with silicon carbide via scanning tunneling microscopy

Gregory M. Rutter; N Guisinger; Jason Crain; Emily A. A. Jarvis; Mark D. Stiles; Tianbo Li; P. N. First; Joseph A. Stroscio

Graphene grown epitaxially on SiC has been proposed as a material for carbon-based electronics. Understanding the interface between graphene and the SiC substrate will be important for future applications. We report the ability to image the interface structure beneath single-layer graphene using scanning tunneling microscopy. Such imaging is possible because the graphene appears transparent at energies of


Physical Review B | 2007

Structural properties of the multilayer graphene/4H-SiC(0001) system as determined by surface x-ray diffraction

J. Hass; Rui Feng; J. E. Millan-Otoya; Xuebin Li; M. Sprinkle; P. N. First; W. A. de Heer; Edward H. Conrad; Claire Berger

\ifmmode\pm\else\textpm\fi{}1\phantom{\rule{0.3em}{0ex}}\mathrm{eV}


Journal of Vacuum Science and Technology | 1992

Microscopic aspects of the initial growth of metastable fcc iron on Au(111)

Joseph A. Stroscio; Daniel T. Pierce; Robert A. Dragoset; P. N. First

above or below the Fermi energy


Physical Review B | 2008

Interface structure of epitaxial graphene grown on 4H-SiC(0001)

J. Hass; J. E. Millan-Otoya; P. N. First; Edward H. Conrad

({E}_{F})


international electron devices meeting | 2007

Pionics: the Emerging Science and Technology of Graphene-based Nanoelectronics

W. A. de Heer; Claire Berger; Edward H. Conrad; P. N. First; Raghunath Murali; J. MeindI

. Our analysis of calculations based on density-functional theory shows how this transparency arises from the electronic structure of a graphene layer on a SiC substrate.


Journal of Vacuum Science and Technology | 2008

Atomic-scale investigation of graphene formation on 6H-SiC(0001)

Nathan P. Guisinger; Gregory M. Rutter; Jason Crain; Christian Heiliger; P. N. First; Joseph A. Stroscio

We present a structural analysis of the multilayer graphene/


Physical Review B | 2012

Silicon intercalation into the graphene-SiC interface

F. Wang; Kristin Shepperd; Jeremy Hicks; Meredith Nevius; Holly Tinkey; A. Tejeda; A. Taleb-Ibrahimi; F. Bertran; P. Le Fèvre; David Torrance; P. N. First; W. A. de Heer; Alexei Zakharov; Edward H. Conrad

4H\mathrm{Si}\mathrm{C}(000\overline{1})


Journal of Vacuum Science & Technology B | 1991

A system for the study of magnetic materials and magnetic imaging with the scanning tunneling microscope

P. N. First; Joseph A. Stroscio; Daniel T. Pierce; Robert A. Dragoset; Robert Celotta

system using surface x-ray reflectivity. We show that graphene films grown on the C-terminated


quantum electronics and laser science conference | 2009

THz carrier dynamics in epitaxial graphene

Charles J. Divin; Dong Sun; Claire Berger; Walt A. de Heer; P. N. First; Theodore B. Norris

(000\overline{1})

Collaboration


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W. A. de Heer

Georgia Institute of Technology

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Claire Berger

Georgia Institute of Technology

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Edward H. Conrad

Georgia Institute of Technology

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J. Hass

Georgia Institute of Technology

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Joseph A. Stroscio

National Institute of Standards and Technology

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J. E. Millan-Otoya

Georgia Institute of Technology

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M. Sprinkle

Georgia Institute of Technology

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Rui Feng

Georgia Institute of Technology

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Xuebin Li

Georgia Institute of Technology

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A. V. Fedorov

Lawrence Berkeley National Laboratory

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