Patrick M. O'Neill

Variable Depth Bragg Peak Method for Single Event Effects Testing

The Variable Depth Bragg Peak (VDBP) method for measuring the Single Event Effects (SEE) cross-section of an integrated circuit (IC) in a closed package as a function of ion linear energy transfer (LET) is described. The method uses long-range, high-energy heavy ions that can penetrate the package and deposit charge in the devices sensitive volume (SV), the depth of which is not known. A series of calibrated energy degraders is used to vary the depth of the Bragg peak relative to the devices sensitive volume. When the Bragg peak is located at the sensitive volume, the measured SEE cross-section is a maximum, as is the LET, which is calculated using a Monte Carlo-based program, TRIM that takes both straggling and spread in beam energy and angle into account. Degrader thickness is varied and the change in LET is calculated while the corresponding cross-section is measured. Good agreement was obtained between the LET-dependence of the single event upset (SEU) cross-section for a 4 Mbit memory in an unopened package using the above method and that for an identical de-lidded part previously measured.

Proton Radiation Test Results on COTS-Based Electronic Devices for NASA-Johnson Space Center Spaceflight Projects

This paper reports the results of recent single event effect (SEE) testing on a variety of commercial-off-the-shelf (COTS) based microelectronic hardware after exposure to 200 Mega-electron-volt (MeV) protons. This hardware was being evaluated for use in both Space Shuttle and International Space Station (ISS) applications. Our approach, test protocol and analysis methodology are discussed

Monte Carlo Simulation of Proton Upsets in Xilinx Virtex-II FPGA Using a Position Dependent

Proton upsets, predicted by the software code, PROPSET, for the Xilinx Virtex-II FPGA and other devices are presented. PROPSET uses heavy-ion upset data to determine the upset energy threshold at each position within the devices sensitive volume. Sensitivity to the shape and thickness of the sensitive volume, to the choice of Weibull parameters and to model physics are explored

{\rm Q}_{\rm crit}

LEO upset rates and bounds due to heavy ion cosmic rays are assessed from 200 MeV proton tests using Monte Carlo simulations of energy deposition distributions in sensitive volumes of 26 parts.

With PROPSET

This paper reports the results of recent proton Single Event Effect (SEE) testing on a variety of COTS and non-COTs electronic devices and assemblies tested for the International Space Station (ISS) and other spaceflight programs.

Risk Assessment Based on Upset Rates From High Energy Proton Tests and Monte Carlo Simulations

We present the results of Single Event Effects (SEE) testing with high energy protons and with low and high energy heavy ions for electrical components considered for Low Earth Orbit (LEO) and for deep space applications.