Pavel A. Belov
Queen Mary University of London
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Publication
Featured researches published by Pavel A. Belov.
Physical Review B | 2006
Pavel A. Belov; Yang Hao
Imaging with sub-wavelength resolution using a lens formed by periodic metal-dielectric layered structure is demonstrated. The lens operates in canalization regime as a transmission device and it does not involve negative refraction and amplification of evanescent modes. The thickness of the lens have to be an integer number of half-wavelengths and can be made as large as required for ceratin applications, in contrast to the other sub-wavelength lenses formed by metallic slabs which have to be much smaller than the wavelength. Resolution of
Physical Review B | 2006
Pavel A. Belov; Yang Hao; Sunil Sudhakaran
\lambda/20
Advanced Materials | 2012
Constantin R. Simovski; Pavel A. Belov; Alexander V. Atrashchenko; Yuri S. Kivshar
at 600 nm wavelength is confirmed by numerical simulation for a 300 nm thick structure formed by a periodic stack of 10 nm layers of glass with
Physical Review B | 2013
Ivan Iorsh; Ivan Mukhin; Ilya V. Shadrivov; Pavel A. Belov; Yuri S. Kivshar
\epsilon=2
Journal of Electromagnetic Waves and Applications | 2002
Pavel A. Belov; Sergei A. Tretyakov; Ari J. Viitanen
and 5 nm layers of metal-dielectric composite with
Physical Review B | 2007
Mário G. Silveirinha; Pavel A. Belov; Constantin R. Simovski
\epsilon=-1
Physical Review B | 2011
Alexey A. Orlov; Pavel M. Voroshilov; Pavel A. Belov; Yuri S. Kivshar
. Resolution of
Nanoscale | 2014
Alexander E. Krasnok; Constantin R. Simovski; Pavel A. Belov; Yuri S. Kivshar
\lambda/60
Physical Review E | 2006
Pavel A. Belov; Mário G. Silveirinha
is predicted for a structure with same thickness, period and operating frequency, but formed by 7.76 nm layers of silicon with
Applied Physics Letters | 2012
Dmitry S. Filonov; Alexander E. Krasnok; Alexey P. Slobozhanyuk; Polina Kapitanova; Elizaveta A. Nenasheva; Yuri S. Kivshar; Pavel A. Belov
\epsilon=15