Peter A. Twombly
IBM
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Publication
Featured researches published by Peter A. Twombly.
vlsi test symposium | 1991
Stephen L. Dingle; Luke D. Lacroix; Peter A. Twombly
Boundary scan has been used extensively by IBM in custom logic, standard cell, and gate array logic chips. Actual implementations of boundary-scan methods used in testing these chips are discussed. The benefits of this approach are reviewed, and an economic analysis of the cost savings attributable to boundary scan are presented.<<ETX>>
Archive | 2009
Adam J. Courchesne; Johnathan P. Ebbers; Kenneth J. Goodnow; Suzanne Granato; Eze Kamanu; Kyle E. Schneider; Peter A. Twombly
Archive | 2009
Kenneth J. Goodnow; Stephen G. Shuma; Peter A. Twombly
Archive | 2008
Corey K. Barrows; Douglas W. Kemerer; Douglas W. Sinut; Peter A. Twombly
Archive | 2012
Kenneth J. Goodnow; Stephen G. Shuma; Peter A. Twombly
Archive | 1987
Robert J. Savaglio; Peter A. Twombly
Archive | 2008
Jonathan P. Ebbers; Todd E. Leonard; Kyle E. Schneider; Peter A. Twombly
Archive | 2007
Serafino Bueti; Kenneth J. Goodnow; Todd E. Leonard; Gregory J. Mann; Peter A. Sandon; Peter A. Twombly; Charles S. Woodruff
Archive | 2008
Kenneth J. Goodnow; Suzanne Granato; Eze Kamanu; Todd E. Leonard; Ramnath Ravindran; Kyle E. Schneider; Peter A. Twombly
Archive | 2008
Kenneth J. Goodnow; Stephen G. Shuma; Peter A. Twombly
