Peter Euteneuer
Leica Microsystems
Network
Latest external collaboration on country level. Dive into details by clicking on the dots.
Publication
Featured researches published by Peter Euteneuer.
Proceedings of SPIE, the International Society for Optical Engineering | 2006
Thomas Sure; Lambert Danner; Peter Euteneuer; Gerhard Hoppen; Armin Pausch; Wolfgang Vollrath
During the last years, new microscope applications require an increased resolution which enforces the development of new state of the art high NA immersion objectives. With the introduction of the 4Pi confocal fluorescence microscope, the increase of the numerical aperture from NA=1.4 to NA=1.46 makes sense, although the gain of lateral resolution is quite small. On the other hand, for inspection and metrology in the semiconductor industry the continuously decreasing structures need the highest possible resolution, which can be achieved with high NA water immersion objectives working in the DUV wavelength range. Building this kind of objectives requires special measuring and testing technologies and a manufacturing precision which has never been realized before in series production.
Archive | 2006
Heinrich Ulrich; Werner Knebel; Kyra Moellmann; Peter Euteneuer
Archive | 2004
Peter Euteneuer; Klaus Hermanns
Archive | 2011
Peter Euteneuer; Ralf Krueger
Archive | 2003
Peter Euteneuer; Klaus Hermanns; Andreas Hund
Archive | 2012
Werner Knebel; Tobias Bauer; Peter Euteneuer
Archive | 2005
Peter Euteneuer; Klaus Hermanns
Archive | 2004
Andreas Hund; Peter Euteneuer; Armin Pausch
Archive | 2004
Heinrich Ulrich; Werner Knebel; Kyra Möllmann; Peter Euteneuer
Archive | 2006
Peter Euteneuer; Ralf Krüger