Ping-Shine Shaw

Status of the stellar x-ray polarimeter for the Spectrum-X-Gamma mission

The Stellar X-Ray Polarimeter (SXRP) uses the polarization sensitivity of a graphite Bragg crystal and a lithium Thomsom scattering target to measure the polarization of X-rays from astrophysical sources. The SXRP is a focal plane detector for the Soviet-Danish SODART telescopes which will be launched on the Soviet Spectrum-X-Gamma mission. The SXRP will be the third orbiting stellar X-ray polarimeter, and should provide an order of magnitude increase in polarization sensitivity over its predecessors.

Stellar X-Ray Polarimeter: a focal plane polarimeter for the Spectrum X-Gamma mission

n this paper we describe an x-ray polarimeter that will be flown on the Spectrum X-Gamma mission. The instrument exploits three distinct physical processes to measure polarization: Bragg reflection from a graphite crystal, Thomson scattering from a metallic lithium target, and pho-toemission from a cesium iodide photocathode. These three methods allow polarization measurements over an energy band from 0.3 to 12 keV. The polarimeter will make possible sensitive measurements of several hundred known x-ray sources, an increase of two orders of magnitude over the x-ray polarimeters flown to date. X-ray polarization measurements will allow us to constrain the geometry of gas flow in x-ray binaries, identify nonthermal emission in supernova remnants, test current models for x-ray emission in radio pulsars, determine the radiation mechanisms in active galactic nuclei, and search for inertial frame dragging (Lense-Thirring effect) around the putative black hole in Cygnus X-1.

An imaging photoemission polarimeter for soft X‐rays

Results of investigations are reviewed to assess the polarization dependence of photoemission in the optical, UV, and soft X-ray bands, as well as present a design for an imaging photoelectric polarimeter. Data regarding the effect of the dependence in the soft X-ray band are emphasized including the quantity of photons produced by each X-ray. The phase shift encountered in some experiments indicates that a third axis is present; the importance of the phase shift in understanding the vectoral photoeffect is emphasized. Measurements of the pulse height show that this measure is proportional to the number of electrons photoemitted by the incident X-ray. The development of X-ray polarimeters can be significantly improved as a result of the study of polarization sensitivity in the photoelectric effect. The design of a photoelectric polarimeter is presented, and the potential uses for the instrument include measuring the polarization of supernova remnants, AGN, and black hole candidates.

Systematic errors in polarization-dependent electron yield experiments

Abstract We critically review experiments that reported that the pulse yield of CsI depends on the state of polarization of the incident X-rays. We show that such experiments, and possibly other polarization dependent experiments, are susceptible to serious systemic errors, particularly at small grazing incidence anges. We present a model that accounts for the different systematic errors, and measurements that demonstrate the validity of the model. We analyze the particular experimental parameters of some of the pulse yield experiments and conclude that their results were affected by the systematic errors and hence have to be retracted. According to a set of measurements designed to avoid these systematic errors the pulse yield of CsI does not depend on the polarization state of the incident X-rays.

THE POLARIZATION DEPENDENCE OF X-RAY PHOTOELECTRON YIELD OF A AU PHOTOCATHODE

We report a measurement of the total photoelectron yield of gold as a function of the incident x‐ray polarization. Polarized x rays with energies of 2.5, 2.7, and 4.0 keV were used to excite a gold photocathode at a glancing incidence angle between 5° and 50°. Contrary to a previous report, we found no measurable polarization dependence for all three x‐ray energies. We conclude that the modulation factor, i.e., the fractional change of the total yield when the polarization state is varied, is less than 4%.

SXRP: an X-ray polarimeter for the SPECTRUM-X-Gamma mission

SummaryTheStellar X-ray Polarimeter (SXRP) is a focal plane instrument which will be flown on the SPECTRUM-X-Gamma mission in 1993. The polarimeter is composed of two separate instruments: the first exploits the dependence on the polarization of the Bragg reflection from a graphite crystal, and of the Thomson scattering from a metallic lithium target. The second instrument makes use of the recently discovered polarization dependence of X-ray photoemission from CsI. The SXRP will permit sensitive measurements of several hundreds of known X-ray sources. X-ray polarization measurements will allow us to constrain the physical mechanisms and the geometries of several classes of galactic X-ray sources, such as X-ray pulsars, black-hole candidates and supernova remnants. Moreover, and for the first time, SXRP will be able to perform highly sensitive measurements of the brightest extragalactic sources.

Vectorial photoelectric effect at 2.69 keV

Recent experiments conducted to study the vectorial photoelectric effect with CsI, Al2O3 and Si photocathodes at 2.69 keV indicate null results. Detailed analysis shows that previously measured modulation can be well explained by geometrical misalignment and a combination of the asymmetric shape of the incident X-ray beam and a small detection area of the photoelectron detector. After the elimination of the sources of spurious modulation, we observed a modulation factor of less than 3 percent for a grazing incidence angle as small as 5 deg. There is no observable difference in the pulse height distribution between s and p states.