Prasad Joglekar

Time of flight spectrometer for background-free positron annihilation induced Auger electron spectroscopy

We describe a novel spectrometer designed for positron annihilation induced Auger electron spectroscopy employing a time-of-flight spectrometer. The spectrometers new configuration enables us to implant monoenergetic positrons with kinetic energies as low as 1.5 eV on the sample while simultaneously allowing for the detection of electrons emitted from the sample surface at kinetic energies ranging from ∼500 eV to 0 eV. The spectrometers unique characteristics made it possible to perform (a) first experiments demonstrating the direct transition of a positron from an unbound scattering state to a bound surface state and (b) the first experiments demonstrating that Auger electron spectra can be obtained down to 0 eV without the beam induced secondary electron background obscuring the low energy part of the spectra. Data are presented which show alternative means of estimating positron surface state binding energy and background-free Auger spectra.

Evidence for a positron bound state on the surface of a topological insulator

We describe experiments aimed at probing the sticking of positrons to the surfaces of topological insulators using the Positron Annihilation induced Auger Electron Spectrometer (PAES). A magnetically guided beam was used to deposit positrons at the surface of Bi2Te2Se sample at energy of ~2eV. Peaks observed in the energy spectra and intensities of electrons emitted as a result of positron annihilation showed peaks at energies corresponding to Auger peaks in Bi, Teand Se providing clear evidence of Auger emission associated with the annihilation of positrons in a surface bound state. Theoretical estimates of the binding energy of this state are compared with estimates obtained by measuring the incident beam energy threshold for secondary electron emission and the temperature dependence positronium(Ps) emission. The experiments provide strong evidence for the existence of a positron bound state at the surface of Bi2Te2Se and indicate the practicality of using positron annihilation to selectively probe the critically important top most layer of topological insulator system.

Measurement of the Positron Annihilation Induced Auger Electron Spectrum from Ag(100)

Research has demonstrated that Positron Annihilation Induced Auger Spectroscopy (PAES) can be used to probe the top-most atomic layer of surfaces and to obtain Auger spectra that are completely free of beam-impact induced secondary background. The high degree of surface selectivity in PAES is a result of the fact that positrons implanted at low energies are trapped with high efficiency at an image-correlation potential well at the surface resulting in almost all of the positrons annihilating with atoms in the top-most layer. Secondary electrons associated with the impact of the incident positrons can be eliminated by a suitable choice of an incident beam energy. In this paper we present the results of measurements of the energy spectrum of electrons emitted as a result of positron annihilation induced Auger electron emission from a clean Ag(100) surface using a series of incident beam energies ranging from 20 eV down to 2 eV. A peak in the spectrum was observed at ~40 eV corresponding to the N2,3VV Auger transition in agreement with previous PAES studies. This peak was accompanied by an even larger low energy tail which persisted even at the lowest beam energies. Our results for Ag(100) are consistent with previous studies of Cu and Au and indicate that a significant fraction of electrons leaving the sample are emitted in the low energy tail and suggest a strong mechanism for energy sharing in the Auger process.